Refine your search:     
Report No.
 - 

Ion tracks in silicon formed by much lower energy deposition than the track formation threshold

Amekura, Hiroshi*; Toulemonde, M.*; Narumi, Kazumasa*; Li, R.*; Chiba, Atsuya*; Hirano, Yoshimi*; Yamada, Keisuke*; Yamamoto, Shunya*; Ishikawa, Norito   ; Okubo, Nariaki   ; Saito, Yuichi*

We report the track formation of 10 nm in diameter in silicon irradiated with 6 MeV C$$_{60}$$, i.e., much lower energy than the previously reported energy threshold.

Accesses

:

- Accesses

InCites™

:

Percentile:71.27

Category:Multidisciplinary Sciences

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.