Characterizing SRAM and FF soft error rates with measurement and simulation

Hashimoto, Masanori*; Kobayashi, Kazutoshi*; Furuta, Jun*; Abe, Shinichiro ; Watanabe, Yukinobu*

Soft error originating from cosmic ray is a serious concern for reliability demanding applications. Device miniaturization and lower voltage operation degrade the immunity of SRAM and flip-flops, and then soft error countermeasures will be demanded in more and more products. This paper characterizes and discusses soft error rates of SRAM and flip-flops in the terrestrial environment with the results of investigation for soft error phenomena by measurements and simulations.

Language	:	English
Journal	:	Integration
Volume	:	69
Number	:
Pages	:	p.161 - 179
Publication Year/Month	:	2019/11
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Paper URL	:	https://doi.org/10.1016/j.vlsi.2019.03.005
DOI for research data	:
Keywords	:	ソフトエラー; SRAM; フリップフロップ; 放射線耐性フリップフロップ; 中性子; アルファ粒子; ミューオン; ソフトエラー率; 照射実験; シミュレーション
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:62.95 Category:Computer Science, Hardware & Architecture
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Registration No. : AA20221047
JAEA Abstracts No. :
Paper Submission No. : 27561

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