Refine your search:     
Report No.

De Haas-van Alphen effect and Fermi surface in UC

Yamamoto, Etsuji ; Haga, Yoshinori ; Maehira, Takahiro*; Inada, Yoshihiko*; Murakawa, Masao*; Onuki, Yoshichika; Hasegawa, Akira*

no abstracts in English



- Accesses





[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.