Relativistic soft X-ray harmonics beam characterizing by high performance imaging using sub-micron resolution LiF detectors

Pikuz, T.; Faenov, A.*; Pirozhkov, A. S.; 錦野 将元; 長谷川 登; Esirkepov, T. Z.; 小瀧 秀行; 林 由紀雄; 小倉 浩一; Koga, J. K.; et al.

no journal, , 

We demonstrated that sub-micron resolution, high dynamic range LiF detectors, based on the formation under EUV and soft X-ray irradiation of optically active color centers, allowed applying a single shot imaging technique for characterizing relativistic high order harmonic beams, generated by an oscillating electron spikes formed in underdense gas jet plasma created by relativistically self-focusing laser pulses. The LiF film was used for near-field diffraction imaging of the HOH beam and investigation of its coherent properties. The focusability of the HOH beam was investigated using spherical Mo/Si mirror and LiF crystal. Using such technique the sizes and complexity of the HOH source structure have been measured.