Relativistic soft X-ray harmonics beam characterizing by high performance imaging using sub-micron resolution LiF detectors

ミクロン以下の分解能を持つLiF検出器を用いた相対論的軟X線高次高調波ビームの性能評価

Pikuz, T.; Faenov, A.*; Pirozhkov, A. S.; 錦野 将元; 長谷川 登; Esirkepov, T. Z.; 小瀧 秀行; 林 由紀雄; 小倉 浩一; Koga, J. K.; 中村 龍史; Bulanov, S. V.; 福田 祐仁; Magnitskii, S.*; Nagorskiy, N.*; Epitshev, M.*; Pikuz, S. A.*; 加藤 義章* ; 河内 哲哉; Bolton, P.; 近藤 公伯; 神門 正城

Pikuz, T.; Faenov, A.*; Pirozhkov, A. S.; Nishikino, Masaharu; Hasegawa, Noboru; Esirkepov, T. Z.; Kotaki, Hideyuki; Hayashi, Yukio; Ogura, Koichi; Koga, J. K.; Nakamura, Tatsufumi; Bulanov, S. V.; Fukuda, Yuji; Magnitskii, S.*; Nagorskiy, N.*; Epitshev, M.*; Pikuz, S. A.*; Kato, Yoshiaki*; Kawachi, Tetsuya; Bolton, P.; Kondo, Kiminori; Kando, Masaki

We demonstrated that sub-micron resolution, high dynamic range LiF detectors, based on the formation under EUV and soft X-ray irradiation of optically active color centers, allowed applying a single shot imaging technique for characterizing relativistic high order harmonic beams, generated by an oscillating electron spikes formed in underdense gas jet plasma created by relativistically self-focusing laser pulses. The LiF film was used for near-field diffraction imaging of the HOH beam and investigation of its coherent properties. The focusability of the HOH beam was investigated using spherical Mo/Si mirror and LiF crystal. Using such technique the sizes and complexity of the HOH source structure have been measured.