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Yamazaki, Satoshi*; Hirose, Kiyoshige*; Sasaki, Hirokazu*; Oba, Yojiro; Miyazawa, Tomotaka*; Onuma, Masato*
Do To Dogokin, 60(1), p.315 - 319, 2021/08
no abstracts in English
Sasaki, Hirokazu*; Nishikubo, Hideo*; Nishida, Shinsuke*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Isomatsu, Takemi*; Minato, Ryuichiro*; Kinugawa, Kohei*; Imamura, Akihiro*; Otomo, Shinya*; et al.
Furukawa Denko Jiho, (138), p.2 - 10, 2019/02
no abstracts in English
Hoshino, Eijiro*; Kobayashi, Daisuke*; Makino, Takahiro; Oshima, Takeshi; Hirose, Kazuyuki*
Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.130 - 133, 2012/12
Single event effects on phase locked loops (PLLs) are experimentally investigated. Test chips of the PLLs are fabricated in a 0.2-
m fully-depleted silicon-on-insulator technology. The PLL architecture is designed in conjunction with hardening techniques such as the triple modular redundancy and a stacked transistor design approach. A heavy-ion beam test confirms that the hardened PLL exhibits higher radiation tolerance than non-hardened one for 7.5-MeV Ne irradiation: The accelerated ions have the linear energy transfer of 7.3 MeV/cm
/mg in Si.
Hirose, Jiro*; Muramatsu, Ken; Okumura, Toshihiko*; Taki, Satoshi*
JAERI-Research 2002-009, 220 Pages, 2002/03
JAERI-Research-2002-009.pdf:13.31MB
This report presents procedures for the determination of Scenario Earthquakes for seismic design based on Probabilistic Seismic Hazard Analysis (PSHA). Recently PSHA was recognized as an important basis to identify dominant earthquakes predicted to threaten the site in future. The identified earthquakes are called Probability-Based Scenario Earthquakes (PBSEs). The concept of PBSEs originates from the studies of US NRC and Ishikawa & Kameda. The objective of this study is to formulate the procedures to determine the PBSEs and, through this application, to demonstrate the feasibility of the application to seismic design. This report consists of three parts, namely, procedures to compile analytical conditions for PBSEs, an assessment to determine PBSEs for a model site using the Ishikawa's concept and examination of uncertainty involved in analytical conditions. The results imply that the procedures based on the Ishikawa's concept is a useful evaluation technique to determine scenario earthquakes for seismic design considering uncertainty involved in analytical conditions.
Hirose, Jiro*; Muramatsu, Ken; Kanda, S.*; Tomishima, S.*; Takeda, Masatoshi*
Transactions of 16th International Conference on Structural Mechanics in Reactor Technology (SMiRT-16) (CD-ROM), 8 Pages, 2001/08
no abstracts in English
Muramatsu, Ken; Hirose, Jiro*; Oikawa, Tetsukuni; Kondo, Masaaki
Proceedings of 15th KAIF/JAERI Annual Meeting, p.229 - 238, 2000/00
no abstracts in English
Hirose, Jiro*; Muramatsu, Ken; Okumura, Toshihiko*; Taki, Satoshi*; Takada, Tsuyoshi*
Proceedings of 5th International Conference on Probabilistic Safety Assessment and Management (PSAM-5), p.1383 - 1390, 2000/00
no abstracts in English
Nishimoto, Wataru*; Kimuro, Harumi*; Ishibashi, Seijiro*; Miyahara, Shuji*; Yamashita, Saburo*; Hayashi, Mitsuo*; Suzuki, Yoji*; Hirose, Yasuo*
PNC TJ118 85-06VOL2, 221 Pages, 1985/04
PNC-TJ118-85-06VOL2.pdf:20.84MB
None
Nishimoto, Wataru*; Kimuro, Harumi*; Ishibashi, Seijiro*; Miyahara, Shuji*; Yamashita, Saburo*; Hayashi, Mitsuo*; Suzuki, Yoji*; Hirose, Yasuo*
PNC TJ118 85-06VOL1, 21 Pages, 1985/04
PNC-TJ118-85-06VOL1.pdf:1.04MB
no abstracts in English
Hoshino, Eijiro*; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Makino, Takahiro; Oshima, Takeshi
no journal, ,
no abstracts in English
m FD-SOI processHoshino, Eijiro*; Shibata, Yuichi*; Kobayashi, Daisuke*; Kakehashi, Yuya*; Makino, Takahiro; Oshima, Takeshi; Hirose, Kazuyuki*
no journal, ,
no abstracts in English
Kobayashi, Daisuke*; Hoshino, Eijiro*; Shibata, Yuichi*; Kakehashi, Yuya*; Hirose, Kazuyuki*; Makino, Takahiro; Oshima, Takeshi
no journal, ,
no abstracts in English
Yamazaki, Satoshi*; Hirose, Kiyoshige*; Sasaki, Hirokazu*; Oba, Yojiro; Miyazawa, Tomotaka*; Onuma, Masato*
no journal, ,
no abstracts in English
