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STRAD project for systematic treatments of radioactive liquid wastes generated in nuclear facilities

渡部 創; 小木 浩通*; 荒井 陽一; 粟飯原 はるか; 高畠 容子; 柴田 淳広; 野村 和則; 神谷 裕一*; 浅沼 徳子*; 松浦 治明*; et al.

Progress in Nuclear Energy, 117, p.103090_1 - 103090_8, 2019/11


 被引用回数:6 パーセンタイル:75.46(Nuclear Science & Technology)

A new collaborative research project for systematic treatments of radioactive liquid wastes containing various reagents generating in nuclear facilities was started from 2018 initiated by Japan Atomic Energy Agency. The project was named as STRAD (Systematic Treatments of RAdioactive liquid wastes for Decommissioning) project. Tentative targets to be studied under the project are aqueous and organic liquid wastes which have been generated by experiments and analyses in a reprocessing experimental laboratory of JAEA. Currently fundamental studies for treatments of the liquid wastes with complicated compositions are underway. In the STRAD project, process flow for treatment of ammonium ion involved in aqueous waste was designed though the inactive experiments, and decomposition of ammonium ion using catalysis will be carried out soon. Adsorbents for recovery of U and Pu from spent solvent were also developed. Demonstration experiments on genuine spent solvent is under planning.


${{it In situ}}$ baking method for degassing of a kicker magnet in accelerator beam line

神谷 潤一郎; 荻原 徳男; 柳橋 亨*; 金正 倫計; 安田 裕一*

Journal of Vacuum Science and Technology A, 34(2), p.021604_1 - 021604_10, 2016/03

 被引用回数:1 パーセンタイル:6.36(Materials Science, Coatings & Films)

J-PARC RCSビーム出射用キッカー電磁石の脱ガスを加速器のビームライン上で、すなわち${{it in situ}}$で行うため手法を開発した。その手法とはヒーターと熱輻射遮蔽板をキッカー電磁石と真空容器間に設置し、熱束の多くをキッカー電磁石へ向けることで、真空容器の熱膨張を発生させずにキッカー電磁石を昇温、脱ガスする手法である。フェライトを120$$^{circ}$$C以上へ昇温すること、及び真空容器の温度上昇を30$$^{circ}$$C以下へ抑えることを目標としてヒーター導入式の脱ガス手法の開発を行った。まず、原理実験を行い、本手法で真空内のキッカー電磁石を昇温できることを確認した。その後、実機への適応を見据え、ヒーターの選択、昇温試験を行い良好な結果を得た。


Beam size reduction of a several hundred-keV compact ion microbeam system by improving the extraction condition in an ion source

石井 保行; 大久保 猛; 神谷 富裕; 齋藤 勇一

Nuclear Instruments and Methods in Physics Research B, 348, p.79 - 82, 2015/04

 被引用回数:2 パーセンタイル:22.25(Instruments & Instrumentation)

A hundreds-keV compact ion microbeam system with a three-stage acceleration lens is under development to form an ion beam of several micrometers in diameter. A proton beam of 17$$mu$$m in diameter was formed in the previous study and the smaller beam size could be expected at the lower pressure. In this study, the vacuum system at the extraction space was improved and the relation between the beam size and vacuum pressure was examined by forming hydrogen ion beams at 130 keV. As a result, the beam size of 5.8 $$mu$$m which almost satisfied our present goal was obtained at the achievably lowest pressure (5$$times$$10$$^{-4}$$ Pa).



横田 渉; 佐藤 隆博; 神谷 富裕; 奥村 進; 倉島 俊; 宮脇 信正; 柏木 啓次; 吉田 健一; 舟山 知夫; 坂下 哲哉; et al.

JAEA-Technology 2014-018, 103 Pages, 2014/09




Magnetic patterning of FeRh thin films by energetic light ion microbeam irradiation

小出 哲也*; 佐藤 隆博; 江夏 昌志; 齋藤 勇一; 神谷 富裕; 大河内 拓雄*; 小嗣 真人*; 木下 豊彦*; 中村 哲也*; 岩瀬 彰宏*; et al.

Japanese Journal of Applied Physics, 53(5S1), p.05FC06_1 - 05FC06_4, 2014/05

 被引用回数:9 パーセンタイル:43.85(Physics, Applied)



Study on ferromagnetic ordering of FeRh thin films induced by energetic heavy ion irradiation by means of X-ray magnetic circular dichroism

愛甲 一馬*; 唐木 淳志*; 奥田 修一*; 齋藤 勇一; 神谷 富裕; 中村 哲也*; 木下 豊彦*; 岩瀬 彰宏*; 松井 利之*

Nuclear Instruments and Methods in Physics Research B, 314, p.99 - 102, 2013/11

 被引用回数:3 パーセンタイル:29.69(Instruments & Instrumentation)

The ion irradiation induced magnetic state of the FeRh thin films with 10 MeV Iodine ion beam has been investigated by the measurements of a superconducting quantum interference device (SQUID) magnetometer and soft X-ray magnetic circular dichroism (XMCD). It was clearly shown in the magnetization loops by SQUID measurements that the ion irradiation induced ferromagnetic state in the FeRh thin films even below room temperature. This was also confirmed by the XMCD measurements. However ion irradiation fluence dependence on magnetic state at the sample surface measured by XMCD was totally different from that by use of SQUID. Moreover, it was revealed by XMCD sum rule analysis that the ion irradiation induced ferromagnetism of FeRh thin films was mainly dominated by the spin moment.


MFM observation of micrometer-sized magnetic patterns produced by heavy ion microbeam irradiation in FeRh films

愛甲 一馬*; 唐木 淳志*; 松井 利之*; 岩瀬 彰宏*; 佐藤 隆博; 高野 勝昌*; 江夏 昌志; 齋藤 勇一; 神谷 富裕

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 133, 2013/01

As the irradiation effect appears only within irradiated regions, we have used ion micro-beam irradiation to produce micrometer-sized and two-dimensional magnetic patterns on the surface of FeRh thin films. The thin films nearly show the anti-ferromagnetic state at room temperature. To realize the lateral magnetic modification on the sample surface, the micro-beam irradiation was performed by using 3-MeV tandem accelerator at the TIARA. The focused 10 MeV iodine ion micro-beam, which had a rectangular shape of 2$$mu$$m $$times$$ 4$$mu$$m, was scanned on the FeRh thin film surface. After irradiation, the surface roughness and the magnetic state were observed by means of atomic force microscopy (AFM) and magnetic force microscopy (MFM), respectively. The AFM images show that the ion micro-beam does not create any topographic modification at the FeRh surface, while an array with 2$$mu$$m $$times$$ 4$$mu$$m bright rectangles at designated regular intervals is seen in the MFM image. The ion micro-beam is a useful tool for the fabrication of two-dimensional and micrometer-sized magnetic patterns on FeRh samples.


Reduction of charging effects on negative secondary ion TOF mass spectra of PMMA using cluster ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅; 神谷 富裕

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 165, 2013/01

Secondary ion (SI) mass spectrometry, based on the phenomenon that primary ion impacts on a target produce SIs originating from the target, is one of the most powerful tools for surface analysis. One of the difficulties in SI mass measurements of insulating targets is to stabilize the surface potential during the measurements, because ion impacts on insulating targets usually lead to an increase in the potential caused by the difference between the injected and emitted charges. We compared time-sequential variations of negative-SI TOF mass spectra of a thin PMMA film target for monoatomic (C$$_1$$$$^+$$) and cluster ions (C$$_8$$$$^+$$) impact with the same incident energy per atom (0.5 MeV/atom) to study difference in charging effects on N-SI mass spectra of insulating targets. For C$$_1$$$$^+$$ impacts, the peak shift to longer flight time and SI intensity reduction are observed. In contrast to the C$$_1$$$$^+$$ impacts, the N-SI TOF mass spectra for C$$_8$$$$^+$$ do not show the peak shift and SI intensity reduction, which shows that the surface potential is stable during the C$$_8$$$$^+$$ bombardment. The results demonstrate that N-SI TOF mass measurement of the insulating thin film target is available using cluster ions as a primary ion without charge compensation.


Ion scattering spectroscopy of polarity-controlled ZnO surfaces by 1-2 MeV C$$^{+}$$ ions

本橋 健次*; 齋藤 勇一; 宮脇 信正; 神谷 富裕

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 135, 2013/01

We studied the mechanism of collisions between 1-2-MeV carbon ions and polarity-controlled ZnO surfaces in order to investigate the efficient reflection of swift ions on solid surfaces for transportation of ion beams without magnetic and/or electrostatic beam handling. The intensities of ions scattered on three different surfaces of Zn and O faces of the ZnO crystals and a polycrystalline Au film were measured by a Si surface barrier detector. As a result, the intensity on the Zn face of the ZnO crystals significantly increased at 2-MeV comparing to that at 1-MeV, although there was a small increase in intensity in the case of the O face of the ZnO and Au surfaces. The details of this finding have not been clarified yet. However, efficient reflection of MeV ions is expected on polarity-controlled ZnO surfaces.


MFM and PEEM observation of micrometre-sized magnetic dot arrays fabricated by ion-microbeam irradiation in FeRh thin films

愛甲 一馬*; 唐木 淳志*; 松井 利之*; 岩瀬 彰宏*; 佐藤 隆博; 高野 勝昌*; 江夏 昌志; 齋藤 勇一; 神谷 富裕; 大河内 拓雄*; et al.

Journal of Synchrotron Radiation, 19(2), p.223 - 226, 2012/03

 被引用回数:6 パーセンタイル:35.76(Instruments & Instrumentation)

FeRh thin films were irradiated with 10 MeV iodine ion microbeam to produce the lateral magnetic modification in micron-meter scale. Two-dimensional magnetic dot arrays with the dimension of approximately 2$$times$$4 $$mu$$m$$^2$$ as well as 10$$times$$10 $$mu$$m$$^2$$ were successfully produced on the FeRh surface, which was observed by magnetic force microscopy. The results of the photoelectron emission microscopy combined with X-ray magnetic circular dichroism reveal that the easy axis of the magnetization of the ion beam irradiated ferromagnetism in the FeRh thin films lies in the film planes along the $$<$$001$$>$$ direction of the MgO substrates.


Secondary ion emission from PTFE upon C$$_{60}$$ ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 高橋 康之*; 鳴海 一雅; 神谷 富裕

JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010, P. 156, 2012/01

Secondary ion (SI) yields from a Poly(tetrafluoroethylene) (PTFE) target for C$$_{60}$$ ion impacts were measured with an energy range from 30 keV to 270 keV by time-of-flight (TOF) SI mass analysis combined with SI electric current measurements. As a result, the use of impacts of C$$_{60}$$ ion with the increased incident energies (60 keV C$$_{60}$$$$^+$$, 120 keV C$$_{60}$$$$^+$$ and 270 keV C$$_{60}$$$$^{2+}$$) provided higher yields of the characteristic positive SIs for PTFE than those of lower energy C$$_{60}$$ ions (30-keV C$$_{60}$$$$^+$$) and advantageous for highly sensitive chemical analysis of PTFE.


Micrometer-sized magnetic patterning of FeRh films using an energetic ion microbeam

藤田 直樹*; 松井 利之*; 小杉 晋也*; 佐藤 隆博; 齋藤 勇一; 高野 勝昌; 江夏 昌志; 神谷 富裕; 関 修平*; 岩瀬 彰宏*

Japanese Journal of Applied Physics, 49(6), p.060211_1 - 060211_3, 2010/06

 被引用回数:11 パーセンタイル:46.09(Physics, Applied)

FeRh thin films were irradiated with a focused 10 MeV I 2 $$times$$ 2 $$mu$$m$$^{2}$$ ion microbeam at intervals of several $$mu$$m. After the irradiations, the magnetic state at the surface was observed by a magnetic force microscopy (MFM). The micrometer-sized regions which were irradiated with the microbeam show ferromagnetic, and the unirradiated regions remain antiferromagnetic. The present result indicates that the energetic ion microbeam can be used as a tool to produce the micrometer-sized modulation of lateral magnetic state of FeRh films.


The Present status of TIARA at JAEA-Takasaki

齋藤 勇一; 横田 渉; 奈良 孝幸; 上松 敬; 奥村 進; 宇野 定則; 石堀 郁夫; 倉島 俊; 吉田 健一; 湯山 貴裕; et al.

Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-8), p.95 - 98, 2008/12

The accelerators at TIARA of Japan Atomic Energy Agency are dedicated to researches in the field of biotechnology and material science. These researches require beams of various ion species covering a wide range of energy and a number of different methods of irradiation. In order to satisfy the requirements, outstanding technologies such as microbeam formation and wide-area high-uniformity irradiation have been developed as well as accelerator technologies. The paper describes the major accelerator/ beam formation/ irradiation technologies developed in recent years.



横田 渉; 奈良 孝幸; 石堀 郁夫; 倉島 俊; 吉田 健一; 湯山 貴裕; 石坂 知久; 上松 敬; 宇野 定則; 千葉 敦也; et al.

Proceedings of 5th Annual Meeting of Particle Accelerator Society of Japan and 33rd Linear Accelerator Meeting in Japan (CD-ROM), p.22 - 24, 2008/08



Dissolution of powdered spent fuel and U crystallization from actual dissolver solution for "NEXT" process development

野村 和則; 比内 浩; 中原 将海; 鍛治 直也; 紙谷 正仁; 大山 孝一; 佐野 雄一; 鷲谷 忠博; 小巻 順

Proceedings of 3rd International ATALANTE Conference (ATALANTE 2008) (CD-ROM), 5 Pages, 2008/05

U crystallization process from the dissolver solution of the spent nuclear fuel has been developed as one of the key essential technologies for the "NEXT" process development. Since several tens % of U is supposed to be recovered at the crystallization process, it is expected to reduce the total mass of nuclear material to be treated in the solvent extraction process. For the U crystallization, it is desirable to prepare the dissolver solution of relatively high U concentration. Although the conventional dissolution method needs significantly long dissolution time in order to obtain the dissolver solution of high U concentration with high dissolution ratio, it is expected the effective dissolution is achieved by powderizing the spent fuel. The beaker-scale experiments on the effective powdered fuel dissolution and the U crystallization from dissolver solution with the irradiated MOX fuel from the experimental fast reactor "JOYO" were carried out at the Chemical Processing Facility (CPF) in Tokai Research and Development Center. The powdered fuel was effectively dissolved into the nitric acid solution and the results were compared with the calculation results of the simulation model. In the U crystallization trials, U crystal was obtained from the actual dissolver solution without any addition of reagent.


High-resolution beam energy-spread measurements using combination of nuclear resonant reactions and a 0$$^{circ}$$ beam line separation

石井 保行; 千葉 敦也; 宇野 定則; 齋藤 勇一; 水橋 清; 田島 訓*; 神谷 富裕

Nuclear Instruments and Methods in Physics Research B, 260(1), p.15 - 19, 2007/07

 被引用回数:0 パーセンタイル:0.01(Instruments & Instrumentation)

イオンマイク、あるいはナノビームを形成するためには色収差の評価が不可欠であり、これに伴い色収差の原因であるビームエネルギー幅の精密な測定が必要である。3MVシングルエンド加速器に接続したマイクロビーム形成装置での色収差の大きさを評価するため、高分解能を有する分析電磁石を用いる一般的な方法を使用することなしにプロトンビーム照射により発生する共鳴核反応を使用したビームエネルギー幅測定方法を開発した。この方法では加速器の電圧校正に用いられてきた共鳴核反応$$^{27}$$A$$ell$$(p, $$gamma$$)$$^{28}$$Siと$$^{24}$$Mg(p, $$gamma$$)$$^{25}$$A$$ell$$のうち、反応幅が200eV以下の反応と試料に入射するビームエネルギーを微細に可変することで、10$$^{-4}$$の分解能を達成した。さらに、静電加速器加速管に設置した永久磁石によりビームを分離し、加速器直線ラインに設置した試料に照射する方法を考案した。これらの方法により分析電磁石を使用せず高分解能でビームエネルギーを測定する方法を開発した。


Separation of actinide elements by solvent extraction using centrifugal contactors in the NEXT process

中原 将海; 佐野 雄一; 駒 義和; 紙谷 正仁; 柴田 淳広; 小泉 務; 小山 智造

Journal of Nuclear Science and Technology, 44(3), p.373 - 381, 2007/03

 被引用回数:26 パーセンタイル:86.4(Nuclear Science & Technology)

NEXTプロセスと名付けられた先進湿式再処理プロセスに関連して、環境負荷低減の観点から簡素化溶媒抽出法によりU, Pu及びNpの共回収、SETFICS法によりAm及びCmの回収が試みられている。単サイクルフローシートを用いたU, Pu及びNpの共回収は、フィード溶液又は洗浄液の高硝酸濃度条件下にて実施した。このうち、フィード溶液を高硝酸濃度に調整した条件においては、フィード溶液中だけでなく、抽出段においてもNp(VI)への酸化を促進することができた。これにより、NpはTBPにより抽出され、U, Pu及びNpを共回収することができた。SETFICS法においては、金属装荷度を増加させるため、TRUEX溶媒を0.2M CMPO/1.0M TBPから0.2M CMPO/1.4M TBPへ変更した。また、「ソルトフリー」の観点から、硝酸ナトリウムに代えて硝酸ヒドロキシルアミンを適用した。この結果、Am及びCmをプロダクト溶液へと回収することができた。高装荷フローシートにおいては、以前のフローシートを比べ、水相廃液及び廃溶媒の流量は、それぞれ47%及び54%ほど減少が見込まれた。本研究では、NEXTプロセスにおける簡素化溶媒抽出法及びSETFICS法のフローシートの有用性を実証することができた。


Measurement and analysis of the fluctuations and poloidal flow on JFT-2M tokamak

星野 克道; 井戸 毅*; 永島 芳彦*; 篠原 孝司; 小川 宏明; 神谷 健作; 川島 寿人; 都筑 和泰*; 草間 義紀; 大麻 和美; et al.

Proceedings of 21st IAEA Fusion Energy Conference (FEC 2006) (CD-ROM), 8 Pages, 2007/03




荒川 和夫; 及川 将一*; 島田 博文*; 神谷 富裕; 中野 隆史*; 遊佐 顕*; 加藤 弘之*; 佐藤 隆博; 上松 敬; 柏木 啓次; et al.

Proceedings of 4th Annual Meeting of Particle Accelerator Society of Japan and 32nd Linear Accelerator Meeting in Japan (CD-ROM), p.279 - 281, 2007/00



Compatibility of reduced activation ferritic steel wall with high performance plasma on JFT-2M

都筑 和泰; 神谷 健作; 篠原 孝司; Bakhtiari, M.*; 小川 宏明; 栗田 源一; 武智 学; 河西 敏; 佐藤 正泰; 川島 寿人; et al.

Nuclear Fusion, 46(11), p.966 - 971, 2006/11

 被引用回数:16 パーセンタイル:51.14(Physics, Fluids & Plasmas)


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