Radiation-induced transient-pulses in logic LSIs for use in space applications

Makino, Takahiro*; Yanagawa, Yoshimitsu*; Kobayashi, Daisuke*; Fukuda, Seisuke*; Hirose, Kazuyuki*; Ikeda, Hirokazu*; Saito, Hirobumi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; et al.

Shingaku Giho, 108(100), p.67 - 72, 2008/06

https://www.ieice.org/ken/paper/20080626VaEv/

SET pulse-widths were measured as a function of LET by using pulse capture circuits. In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system.

The Development of Radiation Hardened Microcomputer System; System Design

Ishibashi, Yuzo; Kuroda, Yoshikatsu*; Nakajima, Atsushi*

PNC TJ8216 98-003, 243 Pages, 1998/03

PNC-TJ8216-98-003.pdf:6.5MB

no abstracts in English