Development of a design support system for geological disposal of radioactive waste using a CIM concept

Sugita, Yutaka; Kageyama, Takeshi*; Makino, Hitoshi; Shimbo, Hiroshi*; Hane, Koji*; Kobayashi, Yuichi*; Fujisawa, Yasuo*; Makanae, Koji*; Yabuki, Nobuyoshi*

Proceedings of 17th International Conference on Computing in Civil and Building Engineering (ICCCBE 2018) (Internet), 8 Pages, 2018/06

https://icccbe2018.exordo.com/files/papers/337/final_draft/iSRE_20180507_Sugita_et_al.pdf

This paper presents status of development of the iSRE (integrated system for repository engineering) as a design supporting system that enables rational designing of a geological disposal repository. The complimentary technique of construction information modeling/management (CIM) has been employed for the development of iSRE. CIM uses a shared three dimensional (3D) model of associated data through common data models. In this paper, as a design support system that conforms to the characteristics of information management about engineering technology represented by repetition of design during the disposal project period, we examined and designed the function of the "iSRE", constructed a prototype, and confirmed the function through a trial simulating actual work in the disposal project. As a result, with respect to the functions of DB and IF of the iSRE, we got a prospect that these functions can be the foundation of information management on engineering technology, and development of the prototype of the iSRE and its test run extracted issues for practical use of such system.

Single event gate rupture in SiC MOS capacitors with different gate oxide thicknesses

Deki, Manato*; Makino, Takahiro; Kojima, Kazutoshi*; Tomita, Takuro*; Oshima, Takeshi

Materials Science Forum, 778-780, p.440 - 443, 2014/02

https://doi.org/10.4028/www.scientific.net/MSF.778-780.440

no abstracts in English

Breakdown voltage in silicon carbide metal-oxide-semiconductor devices induced by ion beams

Oshima, Takeshi; Deki, Manato; Makino, Takahiro; Iwamoto, Naoya; Onoda, Shinobu; Hirao, Toshio*; Kojima, Kazutoshi*; Tomita, Takuro*; Matsuo, Shigeki*; Hashimoto, Shuichi*

AIP Conference Proceedings 1525, p.654 - 658, 2013/04

https://doi.org/10.1063/1.4802408

Metal-Oxide-Semiconductor (MOS) capacitors were fabricated on n-type 4H-SiC epitaxial layers, and the leakage current through the gate oxide during heavy ion irradiation was investigated in order to evaluate dielectric breakdown induced by heavy ions (Single Event Gate Rupture: SEGR). The gate oxide at thickness ranges between 60 and 80 nm was formed using pyrogenic oxidation at 1100 C for 60 min. Circular electrodes with 180 diameter were formed using Al evaporation and a lift-off technique. The leakage current observed through the gate oxide was monitored during 18 MeV oxygen (O) or nickel (Ni) ions. As a result, although no significant difference in the value of the electric field at the dielectric breakdown (around 8.2 MV/cm) was observed between non-irradiated and 18 MeV-O irradiated samples, the value decreased to be 7.3 MV/cm in the case of 18 MeV-Ni ion incidence. The Linier Energy Transfer (LET) for 18 MeV-O is 7 MeV cm/mg, and this value is smaller than that for 18 MeV-Ni (24 MeV cm/mg). Also, 18 MeV-Ni ions deposit energy in narrower regions than 18 MeV-O ions. Thus, it can be concluded that the high density of charge induced by 18 MeV-Ni ions triggers SEGR in SiC MOS capacitors.

Peak degradation of heavy-ion induced transient currents in 6H-SiC MOS capacitor

Makino, Takahiro; Iwamoto, Naoya*; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Nozaki, Shinji*

Materials Science Forum, 717-720, p.469 - 472, 2012/05

https://doi.org/10.4028/www.scientific.net/MSF.717-720.469

The peak amplitude of ion induced transient current in n-type 6H-SiC MOS capacitors decreased as the number of incident ions increased and the decrease was recovered to the initial value by applying a positive bias at +1 V. In addition, we monitored a change in the capacitance for the MOS capacitors during ion irradiation. The capacitances increase as the number of incident ion increase. Thus, the result obtained in this study indicates that the depletion layer decreased as the increasing number of incident ions and saturated. Since the number of incident ions at the peak current saturation corresponds to the saturation of the capacitance, we can conclude that the decrease in peak current comes from the decrease in the depletion layer. In addition, the generation of electron-hole pairs by incident ion may result in the formation of an inversion layer. This would have the effect of shielding the charge carriers from the applied bias further reducing the depletion layer width.

Single-alpha-particle-induced charge transient spectroscopy of the 6H-SiC pn diode irradiated with high-energy electrons

Iwamoto, Naoya; Koizumi, Atsushi*; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koike, Shumpei*; Uchida, Kazuo*; Nozaki, Shinji*

IEEE Transactions on Nuclear Science, 58(6), p.3328 - 3332, 2011/12

https://doi.org/10.1109/TNS.2011.2167631

no abstracts in English

Transient analysis of an extended drift region in a 6H-SiC diode formed by a single alpha particle strike and its contribution to the increased charge collection

Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*

IEEE Transactions on Nuclear Science, 58(1), p.305 - 313, 2011/02

https://doi.org/10.1109/TNS.2010.2096432

no abstracts in English

Enhanced charge collection in drain contact of 6H-SiC MOSFETs induced by heavy ion microbeam

Onoda, Shinobu; Vizkelethy, G.*; Makino, Takahiro; Iwamoto, Naoya; Kojima, Kazutoshi*; Nozaki, Shinji*; Oshima, Takeshi

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.230 - 233, 2010/10

Study on potential impacts of natural phenomena on a HLW geological disposal system

Kawamura, Makoto; Makino, Hitoshi; Sasao, Eiji; Niizato, Tadafumi; Yasue, Kenichi; Asamori, Koichi; Umeda, Koji; Ishimaru, Tsuneari; Osawa, Hideaki; Ebashi, Takeshi; et al.

JAEA-Research 2010-027, 85 Pages, 2010/09

JAEA-Research-2010-027.pdf:9.37MB

Japan Atomic Energy Agency (JAEA) have developed a formal evaluation method to assess the potential impacts of natural phenomena (earthquakes and faulting; volcanism; uplift, subsidence, denudation and sedimentation; climatic and sea-level changes) on a high level radioactive waste (HLW) disposal system for the purpose of maintenance of evaluation method for potential impacts of natural phenomena within more realistic view. In this report, we developed a framework as a part of the total system performance assessment for two purposes: the first one is quantification of relationship of characteristic of natural phenomena between geological environmental conditions (T-H-M-C-G), and the other one is quantification of relationship of T-H-M-C-G condition between parameters of performance assessment. We tried to apply the framework to all natural phenomena to confirm the effectiveness of the framework. On the other hand, we applied an argument-diagram that was developed one of the methods of the knowledge management to elicit future tasks. As a result, to apply the framework, we could show that information integration could carry out efficiently, and information integration was attained by the common framework by combining information on geohistory and existing information of natural phenomena and geological environmental conditions as modern-analogue. We could show that suitable scenarios might be chosen by information integration. Furthermore, we were able to elicit future tasks to this study by applying the argument-diagram.

Study on evaluation method of potential impact of natural phenomena on a HLW disposal system

Kawamura, Makoto; Oi, Takao; Niizato, Tadafumi; Yasue, Kenichi; Tokiwa, Tetsuya; Niwa, Masakazu; Shimada, Koji; Kurosawa, Hideki; Asamori, Koichi; Kawachi, Susumu; et al.

JAEA-Research 2008-018, 47 Pages, 2008/03

JAEA-Research-2008-018.pdf:24.18MB

In this report, we sophisticated the framework as a part of the total system performance assessment for two purposes: the first one is quantification of relationship of characteristic of natural phenomena between geological environmental conditions (THMCG), and the other one is quantification of relationship of THMCG condition between parameters of performance assessment. On the other hand, we applied the sophisticated framework to all natural phenomena. As a result, to apply the sophisticated framework, we could show that information integration could carry out efficiently. Moreover, we have checked that the framework was applicable to all phenomena. Furthermore, we could show that suitable scenarios might be chosen by information integration.

Study on evaluation method for potential impacts of "Natural Phenomena" on a HLW disposal system

Kawamura, Makoto; Oi, Takao; Makino, Hitoshi; Umeda, Koji; Niizato, Tadafumi; Ishimaru, Tsuneari; Seo, Toshihiro

Proceedings of 2006 East Asia Forum on Radwaste Management Conference (2006 EAFORM Conference), p.350 - 367, 2006/11

Evaluation for potential impact of natural phenomena ("earthquakes and fault movement", "volcanism", "uplift, subsidence and denudation", and "climatic and sea-level changes") on a High-Level radioactive Waste (HLW) disposal system is an important issue in safety assessment. In order to develop the perturbation scenario considering diverse and complex impact of natural phenomena comprehensively, it is important to identify the key factors to easily classify and organize these impacts and relate these factors with the system performance. In this method, a series of work to construct scenarios is divided into pieces to facilitate to elicit the features of potential impact of natural phenomena on a HLW disposal system and is organized to create reasonable scenarios with consistency, traceability and adequate conservativeness within realistic view.