Study of beam fluctuation of high speed variably-polarizing undulator APPLE-2 in 2001 Dec.-2002 Nov.

Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Tanaka, Hitoshi*; Takao, Masaru*; Takeuchi, Masao*; Matsushita, Tomohiro*; Aoyagi, Hideki*

JAERI-Tech 2005-027, 29 Pages, 2005/05

JAERI-Tech-2005-027.pdf:5.14MB

We measured the orbit fluctuation caused by APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring by using the developed real time measurement system of electron and photon beam position monitors. We quantitatively found two characteristic fluctuations correlating with the ID23 motion by wavelet transform which is a kind of frequency analysis. One originates from the variation of error field during the ID drive. The other originates from the stray magnetic field leaked from the servomotors for the phase drive. Using these results, we tried to get rid of the effect of error fields on the beam orbit by the precise feed-forward correction table and the stray field shield. Consequently we succeeded in suppressing the orbit fluctuation down to sub-micron during the gap drive, which is observed by photon beam position monitors installed in downstream 20m from each light source point.

Measurement of the orbit fluctuation caused by an insertion device with the amplitude modulation method

Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*

AIP Conference Proceedings 705, p.290 - 293, 2004/00

https://doi.org/10.1063/1.1757791

We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.

Study of closed orbit distortion from high speed phase switching of variably-polarizing undulator APPLE-2 in 2001 March-June

Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Agui, Akane; Yoshigoe, Akitaka; Takeuchi, Masao*; Aoyagi, Hideki*; Okuma, Haruo*

JAERI-Tech 2003-048, 29 Pages, 2003/05

JAERI-Tech-2003-048.pdf:1.14MB

no abstracts in English

Operation of circular dichroism measurements with periodic photon-helicity switching by an APPLE-2 type undulator at BL23SU at SPring-8

Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Matsushita, Tomohiro*; Saito, Yuji; Mizumaki, Masaichiro*; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; et al.

Hoshako, 14(5), p.339 - 348, 2001/11

http://ci.nii.ac.jp/naid/10007157437

no abstracts in English

Soft X-ray beamline specialized for actinides and radioactive materials equipped with a variably polarizing undulator

Yokoya, Akinari; Sekiguchi, Tetsuhiro; Saito, Yuji; Okane, Tetsuo*; Nakatani, Takeshi; Shimada, Taihei; Kobayashi, Hideki*; Takao, Masaru*; Teraoka, Yuden; Hayashi, Yukio; et al.

Journal of Synchrotron Radiation, 5, p.10 - 16, 1998/00

https://doi.org/10.1107/S0909049597010273

no abstracts in English

Magnetic field calculation of variable polarizing undulator (APPLE-type) for SX beamline in the SPring-8

Kobayashi, Hideki*; Sasaki, Shigemi; Shimada, Taihei; Takao, Masaru*; Yokoya, Akinari;

JAERI-Tech 96-013, 32 Pages, 1996/03

JAERI-Tech-96-013.pdf:1.18MB

no abstracts in English

Detailed magnetic field measurement on a hybrid undulator for the JAERI FEL

Nagai, Ryoji; Minehara, Eisuke; Sasaki, Shigemi; Sawamura, Masaru; Sugimoto, Masayoshi; Takao, Masaru*; ; Okubo, Makio; Suzuki, Yasuo; *; et al.

Journal of Nuclear Science and Technology, 32(8), p.715 - 718, 1995/08

https://doi.org/10.3327/jnst.32.715

no abstracts in English

Status of the JAERI free electron laser facility driven by a super conducting rf linac

Minehara, Eisuke; Nagai, Ryoji; Sawamura, Masaru; Takao, Masaru*; Sugimoto, Masayoshi; Sasaki, Shigemi; Okubo, Makio; Kikuzawa, Nobuhiro; *; Suzuki, Yasuo; et al.

Nuclear Instruments and Methods in Physics Research A, 358, p.ABS30 - ABS31, 1995/00

https://doi.org/10.1016/0168-9002(94)01343-8

no abstracts in English

Performance of the optical cavity control system for the JAERI FEL project

; Sugimoto, Masayoshi; Nagai, Ryoji; Sawamura, Masaru; Takao, Masaru*; Kikuzawa, Nobuhiro; Okubo, Makio; Minehara, Eisuke; Suzuki, Yasuo

Nuclear Instruments and Methods in Physics Research A, 358, p.ABS77 - ABS78, 1995/00

https://doi.org/10.1016/0168-9002(94)01572-4

no abstracts in English

On FEL integral equation and electron energy loss in intermediate gain regime

Takao, Masaru*

JAERI-M 94-025, 7 Pages, 1994/03

JAERI-M-94-025.pdf:0.31MB

no abstracts in English