Depth profile analysis of multi-layer laminated thin film interface by spatiotemporal angle-resolved APXPS method

Toyoda, Satoshi*; Yoshimura, Masashi*; Sumida, Hirosuke*; Mineoi, Susumu*; Machida, Masatake*; Yoshigoe, Akitaka; Yoshikawa, Akira*; Suzuki, Satoru*; Yokoyama, Kazushi*

Hoshako, 35(3), p.200 - 206, 2022/05

The present status of spatiotemporal depth profiling analysis of the multilayer stacked film interface based on Ambient Pressure X-ray Photoelectron Spectroscopy (APXPS) is presented. To begin with, depth profiles of the multilayer stacked film interfaces have been achieved by time-division Near Ambient Pressure Hard X-ray Angle-Resolved PhotoEmission Spectroscopy data. We then have promoted our methods to quickly perform peak fittings and depth profiling from time-division angle resolved AP-XPS data including spatial resolution, which enables us to realize spatiotemporal depth profiles of the interfaces under reaction conditions such as oxidation and reduction. In addition, it is found that the traditional maximum entropy method (MEM) combined with Jackknife averaging of sparse modeling is effective to perform dynamic measurement of depth profiles with high precision.

Development of measurement and analysis techniques in X-ray photoelectron spectroscopy; From NAP-HARPES to 4D-XPS

Toyoda, Satoshi*; Yamamoto, Tomoki*; Yoshimura, Masashi*; Sumida, Hirosuke*; Mineoi, Susumu*; Machida, Masatake*; Yoshigoe, Akitaka; Suzuki, Satoru*; Yokoyama, Kazushi*; Ohashi, Yuji*; et al.

Vacuum and Surface Science, 64(2), p.86 - 91, 2021/02

https://doi.org/10.1380/vss.64.86

We have developed measurement and analysis techniques in X-ray photoelectron spectroscopy. To begin with, time-division depth profiles of gate stacked film interfaces have been achieved by NAP-HARPES (Near Ambient Pressure Hard X-ray Angle-Resolved Photo Emission Spectroscopy) data. We then have promoted our methods to quickly perform peak fittings and depth profiling from time-division ARPES data, which enables us to realize 4D-XPS analysis. It is found that the traditional maximum entropy method (MEM) combined with Jackknife averaging of sparse modeling in NAP-HARPES data is effective to perform dynamic measurement of depth profiles with high precision.

Corrosion state of iron and bronze artifacts excavated from Nishizuka Mound, Fukui Prefecture

Mitsui, Seiichiro; Yoshikawa, Hideki; Tokuda, Masashi*; Seiki, Yuji*

Nihon Bunkazai Kagakkai Dai-28-Kai Taikai Kenkyu Happyo Yoshishu, p.54 - 55, 2011/06

Ancient iron and bronze artifacts (ca 1,500 year old) excavated from Nishizuka Mound, Fukui Prefecture, were studied as archaeological analogues for metal overpack corrosion. As for corrosion state, we analyzed corrosion volume with a X-ray CT and corrosion products with a portable XRD/XRF. As results, we found that corrosion volume of bronze artifacts were smaller than those of iron artifacts and that cassiterite (SnO) was present as one of corrosion products on the surface of the bronze artifacts. This suggested that the cassiterite inhibited corrosion reaction of the bronze artifact.

Study on investigation of microbial effects for geological disposal, 2 (Joint research)

Tochigi, Yoshikatsu; Yoshikawa, Hideki; Aoki, Kazuhiro; Yui, Mikazu; Asano, Takahiro*; Honjo, Hideko*; Haginuma, Masashi*; Kawakami, Yasushi*; Suzuki, Kazunori*

JAEA-Research 2008-025, 55 Pages, 2008/03

JAEA-Research-2008-025.pdf:8.55MB

Results of joint research on fiscal year 2006 between Japan Atomic Energy Agency (JAEA) and Institute of Research and Innovative (IRI) titled as "Study on investigation of microbial effects for geological disposal" are described in this report. The objective of this study is to develop a method for estimating microbial effects for barrier performance of geological disposal site. The modeling was performed to examine the effect on the change in groundwater chemistry (mainly by electron acceptors) by microbial metabolism as well as microbial activities. In order to use the data (chemical composition, biomass, etc.) in the MINT code, groundwater was collected from the drilled well prepared for chemical and microbial analyses of groundwater. The well was prepared in observation field near Horonobe Underground Research Center of JAEA in fiscal year 2006. Then, numerical modeling using collected data of groundwater with numerical modeling program code "MINT" considering microbial effects was carried out. The modeling was carried out to evaluate the microbial effect for stability of chemical and microbial composition of groundwater. As the result of the modeling, relatively low microbial effect for groundwater composition was observed in particular for the concentration of dissolved methane, methanogen, sulfur reducing bacteria (SRB) and sulfur ion. The result shows that low redox potential is stable in the well in spite of shallow depth.

Soft-X-ray high-resolution photoemission study on the valence transitions in YbInCu

Sato, Hitoshi*; Yoshikawa, Kunta*; Hiraoka, Koichi*; Arita, Masashi*; Fujimoto, Koji*; Kojima, Kenichi*; Muro, Takayuki*; Saito, Yuji; Sekiyama, Akira*; Suga, Shigemasa*; et al.

Physical Review B, 69(16), p.165101_1 - 165101_6, 2004/04

https://doi.org/10.1103/PhysRevB.69.165101

no abstracts in English

Carbon deposition/erosion and retention of hydrogen isotopes in JT-60U

Hirohata, Yuko*; Tanabe, Tetsuo*; Oya, Yasuhisa*; Shibahara, Takahiro*; Sugiyama, Kazuyoshi*; Oyaizu, Makoto*; Yoshikawa, Akira*; Yoshida, Masashi*; Arai, Takashi; Masaki, Kei; et al.

no journal, , 

no abstracts in English

Blue-light emission from silica substrates implanted Si ions

Miura, Kenta*; Tanemura, Tsuyoshi*; Hommi, Masashi*; Hanaizumi, Osamu*; Yamamoto, Shunya; Takano, Katsuyoshi; Sugimoto, Masaki; Yoshikawa, Masahito

no journal, , 

no abstracts in English

UV and visible light emitting fused-silica substrates fabricated by Si-ion implantation

Umenyi, A. V.*; Hommi, Masashi*; Miura, Kenta*; Hanaizumi, Osamu*; Yamamoto, Shunya; Inoue, Aichi; Yoshikawa, Masahito

no journal, , 

Various works on silicon (Si)-based luminescent materials utilizing the quantum confinement effect, such as Si nanocrystals (Si-NC's), have been reported. Typical fabrication methods of Si-NC's are co-sputtering of Si and SiO, Si-ion implantation into SiO plates, and so on. In this work, we observed ultraviolet (UV)-light emission from Si-ion-implanted fused-silica substrates under different implanting conditions. The implantation energy was 80 keV, and the implantation amount was 210 ions/cm. The Si-implanted substrates were annealed at 11001250C. Photoluminescence (PL) spectra were measured with excitation using a He-Cd laser. UV-PL spectra having peaks around a wavelength of 370 nm were observed from all the samples. The UV-peak wavelengths of the samples are almost the same in spite of the various annealing temperatures. Si-ion-implanted fused-silica are expected to be useful as light sources for next-generation optical-disk systems.

Development of fabrication technique of optical devices using ion beam

Miura, Kenta*; Umenyi, A. V.*; Hanaizumi, Osamu*; Sato, Takahiro; Ishii, Yasuyuki; Okubo, Takeru; Yamazaki, Akiyoshi; Koka, Masashi; Yokoyama, Akihito; Kada, Wataru; et al.

no journal, , 

no abstracts in English

Development of fabrication technique of optical functional devices by ion beam irradiation

Miura, Kenta*; Hanaizumi, Osamu*; Kada, Wataru*; Ozawa, Yusuke*; Inada, Kazuki*; Kubota, Atsushi*; Kawashima, Akihiro*; Sato, Takahiro; Ishii, Yasuyuki; Koka, Masashi; et al.

no journal, , 

no abstracts in English