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measurement and analysis techniques in X-ray photoelectron spectroscopy; From NAP-HARPES to 4D-XPSToyoda, Satoshi*; Yamamoto, Tomoki*; Yoshimura, Masashi*; Sumida, Hirosuke*; Mineoi, Susumu*; Machida, Masatake*; Yoshigoe, Akitaka; Suzuki, Satoru*; Yokoyama, Kazushi*; Ohashi, Yuji*; et al.
Vacuum and Surface Science, 64(2), p.86 - 91, 2021/02
We have developed measurement and analysis techniques in X-ray photoelectron spectroscopy. To begin with, time-division depth profiles of gate stacked film interfaces have been achieved by NAP-HARPES (Near Ambient Pressure Hard X-ray Angle-Resolved Photo Emission Spectroscopy) data. We then have promoted our methods to quickly perform peak fittings and depth profiling from time-division ARPES data, which enables us to realize 4D-XPS analysis. It is found that the traditional maximum entropy method (MEM) combined with Jackknife averaging of sparse modeling in NAP-HARPES data is effective to perform dynamic measurement of depth profiles with high precision.
Yoshino, Hiromitsu; Kishi, Atsuyasu*; Yokota, Hideharu
JAEA-Data/Code 2015-014, 42 Pages, 2015/09
JAEA-Data-Code-2015-014.pdf:11.38MB
JAEA-Data-Code-2015-014-appendix(CD-ROM).zip:4.26MB
Long-term pore-pressure-monitoring has been performed using HDB-1
11 and PB-V01 boreholes in the Horonobe Underground Research Laboratory Project. This report summarizes the results obtained from the starting of monitoring to March 2015.
Yuchi, Yoko; Shibazaki, Hiroaki*; Kudo, Tamotsu; Hidaka, Akihide; Maruyama, Yu; Chino, Eiichi; Nakamura, Hideo; Yoshino, T.*; Suzuki*; Hashimoto, Kazuichiro
JAERI-Conf 2000-015, p.231 - 235, 2000/11
no abstracts in English
Yoshino, Yoko; Takarabe, Kenichi*; Ishii, Masashi*; Katayama, Yoshinori; Shimomura, Osamu
Physica B; Condensed Matter, 273-274, p.781 - 783, 1999/12
Times Cited Count：1 Percentile：8.73(Physics, Condensed Matter)DX state is strongly localized. This nature could be investigated by observing relaxation process of localized electrons to emptied inner shells. We have found two different optical ionization process of the DX center in Al
Ga
As:Se (x=0.33,
(cm
)) by using synchrotron radiation. They are tentatively assigned to be a direct lift of an inner-shell electron to the conduction band (CB) followed by a capture of an electron at the DX center to the emptied inner shell 
K-edge
and the Auger ionization of one electron of the DX center to the CB followed by a capture of another electron to the emptied inner shell K-edge
.
Imai, Tsuyoshi; Ushigusa, Kenkichi; Sakamoto, Keishi; Ikeda, Yoshitaka; Fujii, Tsuneyuki; Saigusa, Mikio; Yoshino, Ryuji; Uehara, Kazuya; Nagashima, Takashi; Kimura, Haruyuki; et al.
Nuclear Fusion, 28(8), p.1341 - 1350, 1988/00
Times Cited Count：24 Percentile：64.83(Physics, Fluids & Plasmas)no abstracts in English
