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Journal Articles

Insight into Kondo screening in the intermediate-valence compound SmOs$$_4$$Sb$$_{12}$$ uncovered by soft X-ray magnetic circular dichroism

Saito, Yuji; Fujiwara, Hidenori*; Yasui, Akira*; Kadono, Toshiharu*; Sugawara, Hitoshi*; Kikuchi, Daisuke*; Sato, Hideyuki*; Suga, Shigemasa*; Yamasaki, Atsushi*; Sekiyama, Akira*; et al.

Physical Review B, 102(16), p.165152_1 - 165152_8, 2020/10

Journal Articles

Revising the 4${it f}$ symmetry in CeCu$$_{2}$$Ge$$_{2}$$; Soft X-ray absorption and hard X-ray photoemission spectroscopy

Aratani, Hidekazu*; Nakatani, Yasuhiro*; Fujiwara, Hidenori*; Kawada, Moeki*; Kanai, Yuina*; Yamagami, Kohei*; Fujioka, Shuhei*; Hamamoto, Satoru*; Kuga, Kentaro*; Kiss, Takayuki*; et al.

Physical Review B, 98(12), p.121113_1 - 121113_6, 2018/09


 Times Cited Count:3 Percentile:63.29(Materials Science, Multidisciplinary)

Journal Articles

Evidence for momentum-dependent heavy fermionic electronic structures; Soft X-ray ARPES for the superconductor CeNi$$_{2}$$Ge$$_{2}$$ in the normal state

Nakatani, Yasuhiro*; Aratani, Hidekazu*; Fujiwara, Hidenori*; Mori, Takeo*; Tsuruta, Atsushi*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; et al.

Physical Review B, 97(11), p.115160_1 - 115160_7, 2018/03


 Times Cited Count:1 Percentile:87.28(Materials Science, Multidisciplinary)

Journal Articles

Preferred site occupation of 3$$d$$ atoms in Ni$$_{x}$$Fe$$_{4-x}$$N (${it x}$ = 1 and 3) films revealed by X-ray absorption spectroscopy and magnetic circular dichroism

Takata, Fumiya*; Ito, Keita*; Takeda, Yukiharu; Saito, Yuji; Takanashi, Koki*; Kimura, Akio*; Suemasu, Takashi*

Physical Review Materials (Internet), 2(2), p.024407_1 - 024407_5, 2018/02

 Times Cited Count:7 Percentile:41.79(Materials Science, Multidisciplinary)

Journal Articles

Circular dichroism in resonant angle-resolved photoemission spectra of LaNi$$_{2}$$Ge$$_{2}$$

Nakatani, Yasuhiro*; Fujiwara, Hidenori*; Aratani, Hidekazu*; Mori, Takeo*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; Yamagami, Hiroshi*; et al.

Journal of Electron Spectroscopy and Related Phenomena, 220, p.50 - 53, 2017/01

 Times Cited Count:1 Percentile:83.16(Spectroscopy)

We report the soft X-ray angle-resolved photoemission study for LaNi$$_{2}$$Ge$$_{2}$$ to reveal the electronic structures derived from non-4$$f$$ bands of the heavy fermion compound CeNi$$_{2}$$Ge$$_{2}$$. The photoemission spectra recorded at the La M$$_{4,5}$$ absorption edges clearly show the enhancement of the La 5$$d$$ components in the valence band spectra. The circular dichroism of photoemission spectra reveals the band-dependent dichroic response due to the orbital symmetry.

Journal Articles

Three-dimensional electronic structures and the metal-insulator transition in Ruddlesden-Popper iridates

Yamasaki, Atsushi*; Fujiwara, Hidenori*; Tachibana, Shoichi*; Iwasaki, Daisuke*; Higashino, Yuji*; Yoshimi, Chiaki*; Nakagawa, Koya*; Nakatani, Yasuhiro*; Yamagami, Kohei*; Aratani, Hidekazu*; et al.

Physical Review B, 94(11), p.115103_1 - 115103_10, 2016/11


 Times Cited Count:12 Percentile:33.62(Materials Science, Multidisciplinary)

In this study, we systematically investigate three-dimensional(3D) momentum-resolved electronic structures of Ruddlesden-Popper-type iridium oxides Sr$$_{n+1}$$Ir$$_{n}$$O$$_{3n+1}$$ using soft-X-ray angle-resolved photoemission spectroscopy (SX-ARPES). Our results provide direct evidence of an insulator-to-metal transition that occurs upon increasing the dimensionality of the IrO$$_{2}$$-plane structure. This transition occurs when the spin-orbit-coupled $$j_{eff}$$ = 1/2 band changes its behavior in the dispersion relation and moves across the Fermi energy. By scanning the photon energy over 350 eV, we reveal the 3D Fermi surface in SrIrO$$_{3}$$ and $$k_{z}$$-dependent oscillations of photoelectron intensity in Sr$$_{3}$$Ir$$_{2}$$O$$_{7}$$. To corroborate the physics deduced using low-energy ARPES studies, we propose to utilize SX-ARPES as a powerful complementary technique, as this method surveys more than one whole Brillouin zone and provides a panoramic view of electronic structures.

Journal Articles

Correlative imaging of live biological cells with a soft X-ray microscope and a fluorescence microscope

Kado, Masataka; Kishimoto, Maki; Tamotsu, Satoshi*; Yasuda, Keiko*; Aoyama, Masato*; Tone, Shigenobu*; Shinohara, Kunio*

AIP Conference Proceedings 1696, p.020019_1 - 020019_4, 2016/01

 Times Cited Count:0 Percentile:100

Soft X-ray microscope is a very powerful tool to observe cellular organelles of living biological cells and many works have demonstrated imaging of inner structures of the cells. However the inner structures are very complicated and it is difficult to identify the organelles obtained with the soft X-ray microscopes. We have proposed a hybrid imaging method with a soft X-ray microscope and a fluorescence microscope that is to observe the same biological cells with the both microscopes at the same time. Using the information of the cellular organelles obtained with the fluorescence microscope, inner structures obtained with the soft X-ray microscope are accurately identified. We have observed living biological cells by the hybrid imaging method. Since the soft X-ray microscope has higher spatial resolution than that of the fluorescence microscope, fine structures of the cellular organelles in the living biological cells were discussed.

Journal Articles

Observation of surface modification of multi-layered mirror induced by soft X-ray laser pulse

Nishikino, Masaharu; Ishino, Masahiko; Ichimaru, Satoshi*; Hatayama, Masatoshi*; Hasegawa, Noboru; Kawachi, Tetsuya

Reza Gakkai Dai-483-Kai Kenkyukai Hokoku; Tanhacho Ryoshi Bimu Hassei To Sono Oyo, p.25 - 28, 2015/12

X-ray ablation has been recently achieved using plasma soft X-ray lasers (SXRLs), laser plasma soft X-rays, and X-ray free electron lasers. In order to study the interactions between picosecond SXRL beams and material and multi-layered structure surfaces were irradiated with SXRL pulse. Following irradiation, the substrate surface was observed using a scanning electron microscope and an atomic force microscope. The surface modifications caused by the SXRL beam were clearly seen. The multi-layered mirror is the important component for the EUV lithography. Then, we have started the damage test of multi-layered structure, and the surface modifications caused by the SXRL pulse irradiations were confirmed.

Journal Articles

Temporal behavior of unresolved transition array emission in water window soft X-ray spectral region from multiply charged ions

Dinh, T.-H.*; Suzuki, Yuhei*; Arai, Goki*; Li, B.*; Dunne, P.*; O'Sullivan, G.*; Fujioka, Shinsuke*; Hasegawa, Noboru; Kawachi, Tetsuya; Nishikino, Masaharu; et al.

Applied Physics Letters, 107(12), p.121101_1 - 121101_5, 2015/09

 Times Cited Count:4 Percentile:73.87(Physics, Applied)

Journal Articles

Observation of dynamics and modification of solid surface using a picosecond soft X-ray laser

Nishikino, Masaharu; Kawachi, Tetsuya; Hasegawa, Noboru; Ishino, Masahiko; Minami, Yasuo*; Suemoto, Toru*; Onishi, Naofumi*; Ito, Atsushi*; Sato, Katsutoshi*; Faenov, A.*; et al.

X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.958902_1 - 958902_7, 2015/09

Journal Articles

The Observation of a transient surface morphology in the femtosecond laser ablation process by using the soft X-ray laser probe

Hasegawa, Noboru; Nishikino, Masaharu; Tomita, Takuro*; Onishi, Naofumi*; Ito, Atsushi*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Izutsu, Rui*; Minami, Yasuo*; Baba, Motoyoshi*; et al.

X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890A_1 - 95890A_8, 2015/09

 Times Cited Count:1 Percentile:35.91

We have improved a soft X-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (before 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft X-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.

Journal Articles

Output beam polarisation of X-ray lasers with transient inversion

Janulewicz, K. A.*; Kim, C. M.*; Steil, H.*; Kawachi, Tetsuya; Nishikino, Masaharu; Hasegawa, Noboru

X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890N_1 - 95890N_7, 2015/09

 Times Cited Count:0 Percentile:100

We describe measurement results on the polarization state of amplified spontaneous emission signal from a collisionally pumped Ni-like Ag soft X-ray laser with a transient inversion. The result obtained with a calibrated membrane beam splitter as a polarization state (P-state) selector shows that dominance one of the mutually perpendicular electric field components (p- or s-) in the output signal depends on the hydrodynamic state of the plasma medium. Two different hydrodynamic states were referred as a low gain and high gain regimes and the allocated P-states had dominant s- and p-component, respectively. It was also shown that due to correlations between p- and s-components in the process of coherent amplification of noise, correct description of the polarization state requires applying the generalized theory of polarization and formulated there the generalized degree of polarization.

Journal Articles

Observation of the dependence on the fluence and materials in femto-second laser ablation process by using the soft X-ray laser probe

Hasegawa, Noboru; Tomita, Takuro*; Nishikino, Masaharu; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Minami, Yasuo*; Baba, Motoyoshi*; Onishi, Naofumi*; Ito, Atsushi*; Kawachi, Tetsuya; et al.

JAEA-Conf 2015-001, p.17 - 20, 2015/07

We have succeeded in simultaneous observation of the ablation front and the expansion front with thin filmy structure in the femto-second laser ablation process of a gold target by using the 13.9 nm soft X-ray probe (incident angle to the sample $$sim$$ 70 deg) with soft X-ray interferometer. The dependence on the laser local fluence and materials was obtained by the comparison between gold and tungsten.

Journal Articles

Applications of multilayered gratings to synchrotron light sources; New horizon of diffraction grating monochromators in the keV region

Koike, Masato; Imazono, Takashi; Ishino, Masahiko

X-sen Bunseki No Shimpo, 46, p.159 - 166, 2015/03

The demand for the physical-properties research using powerful light sources, such as synchrotron radiation and soft-X-rays laser light, is increasing. When promoting such research, it is required to develop efficient soft-X-ray spectrometers suitable for absorption, emission, and fluorescence which are appeared in an energy rage of 1-8 keV. We describe the development of laminar type diffraction gratings which enhance diffraction efficiency remarkably by use of soft-X-ray multilayers instead of single metal layers.

Journal Articles

Observation of femtosecond laser ablation on Tungsten by using soft X-ray reflection and interference imaging

Nishikino, Masaharu; Hasegawa, Noboru; Tomita, Takuro*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Onishi, Naofumi*; Ito, Atsushi*; Baba, Motoyoshi*; Minami, Yasuo*; Kawachi, Tetsuya; et al.

Reza Gakkai Dai-471-Kai Kenkyukai Hokoku; Tanhacho Ryoshi Bimu Hassei To Sono Oyo, p.9 - 12, 2014/12

no abstracts in English

Journal Articles

Submicron scale image observation with a grazing incidence reflection-type single-shot soft X-ray microscope

Baba, Motoyoshi*; Nishikino, Masaharu; Hasegawa, Noboru; Tomita, Takuro*; Minami, Yasuo*; Takei, Ryota*; Yamagiwa, Mitsuru; Kawachi, Tetsuya; Suemoto, Toru

Japanese Journal of Applied Physics, 53(8), p.080302_1 - 080302_4, 2014/08

 Times Cited Count:7 Percentile:60.28(Physics, Applied)

A grazing incidence reflection-type soft X-ay microscope, using a Fresnel zone plate and a soft X-ray laser with wavelength 13.9 nm and pulse width 7 ps, was developed. Submicron size groove structures made on a Pt film were clearly captured at a single shot exposure, with spatial resolution of about 360 nm. A wide field view of 100 $$mu$$m square was secured under the Kohler illumination. This microscope also had a large depth of focus of more than 100 $$mu$$m and was proven to have a sufficient performance for observing surface morphological changes.

Journal Articles

X-ray absorption magnetic circular dichroism of (La,Ce)MnO$$_{3}$$ thin films

Yanagida, Tsuyoshi*; Saito, Yuji; Takeda, Yukiharu; Fujimori, Atsushi*; Tanaka, Hidekazu*; Kawai, Tomoji*

Physical Review B, 79(13), p.132405_1 - 132405_4, 2009/04


 Times Cited Count:11 Percentile:50.78(Materials Science, Multidisciplinary)

Creating a bipolarity of semiconductors has been a key technology to develop recent advanced semiconductor devices. Although theoretical calculation predicts the presence of ferromagnetic electron-doped manganites with doping tetravalent cations, the ferromagnetic origin in experiments has been controversial due to the lack of direct experimental evidence. Here, we investigate the ferromagnetism in (La,Ce)MnO$$_{3}$$ thin films by measuring the magnetic circular dichroism in soft X-ray absorption (XMCD). The XMCD measurements clarified that the ferromagnetism is not caused by the presence of Mn$$^{2+}$$ but by self-hole doping for manganese.

Journal Articles

Characterization of surface carbon films on weathered Japanese roof tiles by soft X-ray spectroscopy

Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Hirose, Mika*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

X-Ray Spectrometry, 34(6), p.509 - 513, 2005/11

 Times Cited Count:0 Percentile:100(Spectroscopy)

Surface carbon films on the weathered Japanese roof tiles were characterized by soft X-ray spectroscopy. From the X-ray absorption measurements, it was confirmed that the surface carbon films were oxidized by weathering. On the ohterhand, from the X-ray emission measurements, it can be confirmed that the degree of the orientation was kept in the inner carbon films.

JAEA Reports

Development of multilayer mirrors for use in the wavelength region of 4 nm

Ishino, Masahiko; Yoda, Osamu*; Koike, Masato

JAERI-Research 2005-019, 13 Pages, 2005/09


We have developed soft X-ray multilayer mirrors for use around the wavelength region of 4 nm including the K-absorption edge of carbon ($$lambda = 4.4 nm$$). We have chosen Co$$_3$$O$$_4$$ and Cr as the final candidate materials for absorber layers, and SiO$$_2$$ and Sc for the spacer materials as the result of theoretical invitation. Co$$_3$$O$$_4$$/SiO$$_2$$, Co$$_3$$O$$_4$$/Sc and Cr/Sc multilayer mirrors have been fabricated by means of an ion beam sputtering (IBS) method. As the result of structure evaluations with X-ray diffraction measurement, we have found that the fabricated Co$$_3$$O$$_4$$/Sc and Cr/Sc multilayer mirrors have stable structures. Soft X-ray reflectivity measurements for fabricated multilayer mirrors are carried out in the wavelength region of 4 nm with a synchrotron radiation source. We have found that the Cr/Sc multilayer mirror has a high soft X-ray reflectivity. However, soft X-ray reflectivities below the absorption edge of carbon are reduced. The analyses obtained by EPMA and SIMS suggested that this phenomenon was attributed to contamination of carbon.

Journal Articles

Element-selective observation of electronic structure transition between semiconducting and metallic states in boron-doped diamond using soft X-ray emission and absorption spectroscopy

Iihara, Junji*; Muramatsu, Yasuji; Takebe, Toshihiko*; Sawamura, Akitaka*; Namba, Akihiko*; Imai, Takahiro*; Denlinger, J. D.*; Perera, R. C. C.*

Japanese Journal of Applied Physics, Part 1, 44(9A), p.6612 - 6617, 2005/09

 Times Cited Count:11 Percentile:56.8(Physics, Applied)

Electronic structure transition between semiconducting and metallic states in boron (B) -doped diamonds was element-selectively observed by soft X-ray emission and absorption spectroscopy using synchrotron radiation. For the lightly B-doped diamonds, the B 2$$p$$-density of states (DOS) in the valence band were enhanced with a steep-edge-feature near the Fermi level, and localized acceptor levels, characteristic of semiconductors, were clearly observed both in B 2$$p$$- and C 2$$p$$-DOS in the conduction bands. For the heavily B-doped diamonds, the localized acceptor levels developed into extended energy levels and new energy levels were generated to form an extended conduction band structure which overlapped with the valence band. Thus, this clarified that the metallic energy band structure is actually formed by heavy boron doping. Such valence and conduction band structures observed by soft X-ray emission and absorption spectroscopy well accounted for the electrical properties of the B-doped diamonds.

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