Aratani, Hidekazu*; Nakatani, Yasuhiro*; Fujiwara, Hidenori*; Kawada, Moeki*; Kanai, Yuina*; Yamagami, Kohei*; Fujioka, Shuhei*; Hamamoto, Satoru*; Kuga, Kentaro*; Kiss, Takayuki*; et al.
Physical Review B, 98(12), p.121113_1 - 121113_6, 2018/09
Nakatani, Yasuhiro*; Aratani, Hidekazu*; Fujiwara, Hidenori*; Mori, Takeo*; Tsuruta, Atsushi*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; et al.
Physical Review B, 97(11), p.115160_1 - 115160_7, 2018/03
Takata, Fumiya*; Ito, Keita*; Takeda, Yukiharu; Saito, Yuji; Takanashi, Koki*; Kimura, Akio*; Suemasu, Takashi*
Physical Review Materials (Internet), 2(2), p.024407_1 - 024407_5, 2018/02
Nakatani, Yasuhiro*; Fujiwara, Hidenori*; Aratani, Hidekazu*; Mori, Takeo*; Tachibana, Shoichi*; Yamaguchi, Takashi*; Kiss, Takayuki*; Yamasaki, Atsushi*; Yasui, Akira*; Yamagami, Hiroshi*; et al.
Journal of Electron Spectroscopy and Related Phenomena, 220, p.50 - 53, 2017/01
We report the soft X-ray angle-resolved photoemission study for LaNiGe to reveal the electronic structures derived from non-4 bands of the heavy fermion compound CeNiGe. The photoemission spectra recorded at the La M absorption edges clearly show the enhancement of the La 5 components in the valence band spectra. The circular dichroism of photoemission spectra reveals the band-dependent dichroic response due to the orbital symmetry.
Yamasaki, Atsushi*; Fujiwara, Hidenori*; Tachibana, Shoichi*; Iwasaki, Daisuke*; Higashino, Yuji*; Yoshimi, Chiaki*; Nakagawa, Koya*; Nakatani, Yasuhiro*; Yamagami, Kohei*; Aratani, Hidekazu*; et al.
Physical Review B, 94(11), p.115103_1 - 115103_10, 2016/11
In this study, we systematically investigate three-dimensional(3D) momentum-resolved electronic structures of Ruddlesden-Popper-type iridium oxides SrIrO using soft-X-ray angle-resolved photoemission spectroscopy (SX-ARPES). Our results provide direct evidence of an insulator-to-metal transition that occurs upon increasing the dimensionality of the IrO-plane structure. This transition occurs when the spin-orbit-coupled = 1/2 band changes its behavior in the dispersion relation and moves across the Fermi energy. By scanning the photon energy over 350 eV, we reveal the 3D Fermi surface in SrIrO and -dependent oscillations of photoelectron intensity in SrIrO. To corroborate the physics deduced using low-energy ARPES studies, we propose to utilize SX-ARPES as a powerful complementary technique, as this method surveys more than one whole Brillouin zone and provides a panoramic view of electronic structures.
Kado, Masataka; Kishimoto, Maki; Tamotsu, Satoshi*; Yasuda, Keiko*; Aoyama, Masato*; Tone, Shigenobu*; Shinohara, Kunio*
AIP Conference Proceedings 1696, p.020019_1 - 020019_4, 2016/01
Soft X-ray microscope is a very powerful tool to observe cellular organelles of living biological cells and many works have demonstrated imaging of inner structures of the cells. However the inner structures are very complicated and it is difficult to identify the organelles obtained with the soft X-ray microscopes. We have proposed a hybrid imaging method with a soft X-ray microscope and a fluorescence microscope that is to observe the same biological cells with the both microscopes at the same time. Using the information of the cellular organelles obtained with the fluorescence microscope, inner structures obtained with the soft X-ray microscope are accurately identified. We have observed living biological cells by the hybrid imaging method. Since the soft X-ray microscope has higher spatial resolution than that of the fluorescence microscope, fine structures of the cellular organelles in the living biological cells were discussed.
Nishikino, Masaharu; Ishino, Masahiko; Ichimaru, Satoshi*; Hatayama, Masatoshi*; Hasegawa, Noboru; Kawachi, Tetsuya
Reza Gakkai Dai-483-Kai Kenkyukai Hokoku; Tanhacho Ryoshi Bimu Hassei To Sono Oyo, p.25 - 28, 2015/12
X-ray ablation has been recently achieved using plasma soft X-ray lasers (SXRLs), laser plasma soft X-rays, and X-ray free electron lasers. In order to study the interactions between picosecond SXRL beams and material and multi-layered structure surfaces were irradiated with SXRL pulse. Following irradiation, the substrate surface was observed using a scanning electron microscope and an atomic force microscope. The surface modifications caused by the SXRL beam were clearly seen. The multi-layered mirror is the important component for the EUV lithography. Then, we have started the damage test of multi-layered structure, and the surface modifications caused by the SXRL pulse irradiations were confirmed.
Dinh, T.-H.*; Suzuki, Yuhei*; Arai, Goki*; Li, B.*; Dunne, P.*; O'Sullivan, G.*; Fujioka, Shinsuke*; Hasegawa, Noboru; Kawachi, Tetsuya; Nishikino, Masaharu; et al.
Applied Physics Letters, 107(12), p.121101_1 - 121101_5, 2015/09
Nishikino, Masaharu; Kawachi, Tetsuya; Hasegawa, Noboru; Ishino, Masahiko; Minami, Yasuo*; Suemoto, Toru*; Onishi, Naofumi*; Ito, Atsushi*; Sato, Katsutoshi*; Faenov, A.*; et al.
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.958902_1 - 958902_7, 2015/09
Hasegawa, Noboru; Nishikino, Masaharu; Tomita, Takuro*; Onishi, Naofumi*; Ito, Atsushi*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Izutsu, Rui*; Minami, Yasuo*; Baba, Motoyoshi*; et al.
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890A_1 - 95890A_8, 2015/09
We have improved a soft X-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (before 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft X-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.
Janulewicz, K. A.*; Kim, C. M.*; Steil, H.*; Kawachi, Tetsuya; Nishikino, Masaharu; Hasegawa, Noboru
X-Ray Lasers and Coherent X-Ray Sources; Development and Applications XI (Proceedings of SPIE, Vol.9589), p.95890N_1 - 95890N_7, 2015/09
We describe measurement results on the polarization state of amplified spontaneous emission signal from a collisionally pumped Ni-like Ag soft X-ray laser with a transient inversion. The result obtained with a calibrated membrane beam splitter as a polarization state (P-state) selector shows that dominance one of the mutually perpendicular electric field components (p- or s-) in the output signal depends on the hydrodynamic state of the plasma medium. Two different hydrodynamic states were referred as a low gain and high gain regimes and the allocated P-states had dominant s- and p-component, respectively. It was also shown that due to correlations between p- and s-components in the process of coherent amplification of noise, correct description of the polarization state requires applying the generalized theory of polarization and formulated there the generalized degree of polarization.
Hasegawa, Noboru; Tomita, Takuro*; Nishikino, Masaharu; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Minami, Yasuo*; Baba, Motoyoshi*; Onishi, Naofumi*; Ito, Atsushi*; Kawachi, Tetsuya; et al.
JAEA-Conf 2015-001, p.17 - 20, 2015/07
We have succeeded in simultaneous observation of the ablation front and the expansion front with thin filmy structure in the femto-second laser ablation process of a gold target by using the 13.9 nm soft X-ray probe (incident angle to the sample 70 deg) with soft X-ray interferometer. The dependence on the laser local fluence and materials was obtained by the comparison between gold and tungsten.
Koike, Masato; Imazono, Takashi; Ishino, Masahiko
X-sen Bunseki No Shimpo, 46, p.159 - 166, 2015/03
The demand for the physical-properties research using powerful light sources, such as synchrotron radiation and soft-X-rays laser light, is increasing. When promoting such research, it is required to develop efficient soft-X-ray spectrometers suitable for absorption, emission, and fluorescence which are appeared in an energy rage of 1-8 keV. We describe the development of laminar type diffraction gratings which enhance diffraction efficiency remarkably by use of soft-X-ray multilayers instead of single metal layers.
Nishikino, Masaharu; Hasegawa, Noboru; Tomita, Takuro*; Eyama, Tsuyoshi*; Kakimoto, Naoya*; Onishi, Naofumi*; Ito, Atsushi*; Baba, Motoyoshi*; Minami, Yasuo*; Kawachi, Tetsuya; et al.
Reza Gakkai Dai-471-Kai Kenkyukai Hokoku; Tanhacho Ryoshi Bimu Hassei To Sono Oyo, p.9 - 12, 2014/12
no abstracts in English
Baba, Motoyoshi*; Nishikino, Masaharu; Hasegawa, Noboru; Tomita, Takuro*; Minami, Yasuo*; Takei, Ryota*; Yamagiwa, Mitsuru; Kawachi, Tetsuya; Suemoto, Toru
Japanese Journal of Applied Physics, 53(8), p.080302_1 - 080302_4, 2014/08
A grazing incidence reflection-type soft X-ay microscope, using a Fresnel zone plate and a soft X-ray laser with wavelength 13.9 nm and pulse width 7 ps, was developed. Submicron size groove structures made on a Pt film were clearly captured at a single shot exposure, with spatial resolution of about 360 nm. A wide field view of 100 m square was secured under the Kohler illumination. This microscope also had a large depth of focus of more than 100 m and was proven to have a sufficient performance for observing surface morphological changes.
Yanagida, Tsuyoshi*; Saito, Yuji; Takeda, Yukiharu; Fujimori, Atsushi*; Tanaka, Hidekazu*; Kawai, Tomoji*
Physical Review B, 79(13), p.132405_1 - 132405_4, 2009/04
Creating a bipolarity of semiconductors has been a key technology to develop recent advanced semiconductor devices. Although theoretical calculation predicts the presence of ferromagnetic electron-doped manganites with doping tetravalent cations, the ferromagnetic origin in experiments has been controversial due to the lack of direct experimental evidence. Here, we investigate the ferromagnetism in (La,Ce)MnO thin films by measuring the magnetic circular dichroism in soft X-ray absorption (XMCD). The XMCD measurements clarified that the ferromagnetism is not caused by the presence of Mn but by self-hole doping for manganese.
Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Hirose, Mika*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*
X-Ray Spectrometry, 34(6), p.509 - 513, 2005/11
Surface carbon films on the weathered Japanese roof tiles were characterized by soft X-ray spectroscopy. From the X-ray absorption measurements, it was confirmed that the surface carbon films were oxidized by weathering. On the ohterhand, from the X-ray emission measurements, it can be confirmed that the degree of the orientation was kept in the inner carbon films.
Ishino, Masahiko; Yoda, Osamu*; Koike, Masato
JAERI-Research 2005-019, 13 Pages, 2005/09
We have developed soft X-ray multilayer mirrors for use around the wavelength region of 4 nm including the K-absorption edge of carbon (). We have chosen CoO and Cr as the final candidate materials for absorber layers, and SiO and Sc for the spacer materials as the result of theoretical invitation. CoO/SiO, CoO/Sc and Cr/Sc multilayer mirrors have been fabricated by means of an ion beam sputtering (IBS) method. As the result of structure evaluations with X-ray diffraction measurement, we have found that the fabricated CoO/Sc and Cr/Sc multilayer mirrors have stable structures. Soft X-ray reflectivity measurements for fabricated multilayer mirrors are carried out in the wavelength region of 4 nm with a synchrotron radiation source. We have found that the Cr/Sc multilayer mirror has a high soft X-ray reflectivity. However, soft X-ray reflectivities below the absorption edge of carbon are reduced. The analyses obtained by EPMA and SIMS suggested that this phenomenon was attributed to contamination of carbon.
Iihara, Junji*; Muramatsu, Yasuji; Takebe, Toshihiko*; Sawamura, Akitaka*; Namba, Akihiko*; Imai, Takahiro*; Denlinger, J. D.*; Perera, R. C. C.*
Japanese Journal of Applied Physics, Part 1, 44(9A), p.6612 - 6617, 2005/09
Electronic structure transition between semiconducting and metallic states in boron (B) -doped diamonds was element-selectively observed by soft X-ray emission and absorption spectroscopy using synchrotron radiation. For the lightly B-doped diamonds, the B 2-density of states (DOS) in the valence band were enhanced with a steep-edge-feature near the Fermi level, and localized acceptor levels, characteristic of semiconductors, were clearly observed both in B 2- and C 2-DOS in the conduction bands. For the heavily B-doped diamonds, the localized acceptor levels developed into extended energy levels and new energy levels were generated to form an extended conduction band structure which overlapped with the valence band. Thus, this clarified that the metallic energy band structure is actually formed by heavy boron doping. Such valence and conduction band structures observed by soft X-ray emission and absorption spectroscopy well accounted for the electrical properties of the B-doped diamonds.
Koike, Masato; Sano, Kazuo*
Dai-5-Han Jikken Kagaku Koza 10; Busshitsu No Kozo 2, Bunko (Ge), 10, p.106 - 153, 2005/08
The chapter provides the basic knowledge of "vacuum ultraviolet spectrometers" and "ray racing" for young scientists without reading the numerous references and is intend to be the handbook for the specialist in various related sciences when they initiate spectroscopic experiments in the vacuum ultraviolet region. The content includes the basis of diffraction gratings, Optical properties of diffraction gratings, aberration theories, diffraction efficiency theories, basis of spectrometers, vacuum ultraviolet plane grating spectrometers, vacuum ultraviolet concave grating spectrometers, soft x-ray plane grating spectrometers, soft x-ray concave grating spectrometers, basis of ray tracing, applications of ray tracing, analytic design method, hybrid design method, etc.