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Toigawa, Tomohiro; Kai, Takeshi; Kumagai, Yuta; Yokoya, Akinari*
Journal of Chemical Physics, 160(21), p.214119_1 - 214119_9, 2024/06
The spur reaction is crucial for determining radiolysis or photolysis in liquid, but the spur expansion process has yet to be elucidated. One reason is the need to understand the role of the dielectric response of the solvating molecules surrounding the charged species generated by ionization. The dielectric response corresponds to the time evolution of the permittivity and might affect the chemical reaction-diffusion of the species in a spur expansion process. This study examined the competitive relationship between reaction-diffusion kinetics and the dielectric response by solving the Debye-Smoluchowski equation while considering the dielectric response. The Coulomb force between the charged species gradually decreases with the dielectric response. Our calculation results found a condition where fast recombination occurs before the dielectric response is complete. Although it has been reported that the primary G-values of free electrons depend on the static dielectric constant under low-linear-energy transfer radiation-induced ionization, we propose that considering the dielectric response can provide a deeper insight into fast recombination reactions under high-linear-energy transfer radiation- or photo-induced ionization. Our simulation method enables the understanding of fast radiation-induced phenomena in liquids.
Inoue, Rintaro*; Kanaya, Toshiji*; Yamada, Takeshi*; Shibata, Kaoru; Fukao, Koji*
Physical Review E, 97(1), p.012501_1 - 012501_6, 2018/01
Times Cited Count：9 Percentile：61.69(Physics, Fluids & Plasmas)In this study, we investigate the 
process of a polystyrene thin film using inelastic neutron scattering (INS), dielectric relaxation spectroscopy (DRS), and thermal expansion spectroscopy (TES). The DRS and TES measurements exhibited a decrease in glass transition temperature (
) with film thickness. On the other hand, an increase in was observed in INS studies. In order to interpret this contradiction, we investigated the temperature dependence of the peak frequency (
) of the process probed by DRS and TES. The experiments revealed an increase in the peak frequency () with decreasing film thickness in the frequency region. This observation is consistent with the observed decrease in with thickness. The discrepancy between INS and DRS or TES descriptions of the process is likely to be attributed to a decrease in the apparent activation energy with film thickness and reduced mobility, due to the impenetrable wall effect.
Kanari, Moriyasu*; Abe, Tetsuya; Enoeda, Mikio; ; ; Shimizu, Katsusuke*; ; Takatsu, Hideyuki
JAERI-Research 98-029, 23 Pages, 1998/06
JAERI-Research-98-029.pdf:2.51MB
no abstracts in English
Kasugai, Atsushi; Takahashi, Koji; Sakamoto, Keishi; Yamamoto, Takumi; Tsuneoka, Masaki; Kariya, Tsuyoshi*; Imai, Tsuyoshi
Japanese Journal of Applied Physics, Part 1, 36(5A), p.2883 - 2887, 1997/00
Times Cited Count：4 Percentile：27.95(Physics, Applied)no abstracts in English
; ; Ogawa, Toru
JAERI-Tech 96-026, 21 Pages, 1996/06
no abstracts in English
; ; ; ; Ito, Masayuki; Seguchi, Tadao
IEEE Trans. Dielect. Elect. Insul., 2(1), p.54 - 61, 1995/02
Times Cited Count：12 Percentile：67.65(Engineering, Electrical & Electronic)no abstracts in English
; ; Ogawa, Toru
JAERI-Tech 94-010, 33 Pages, 1994/07
no abstracts in English
Kanno, Ikuo
Journal of Nuclear Science and Technology, 28(11), p.1061 - 1064, 1991/11
no abstracts in English
Kanno, Ikuo; Ikezoe, Hiroshi; Otsuki, Tsutomu*; ; ; Kimura, Itsuro*
Journal of Nuclear Science and Technology, 28(6), p.582 - 584, 1991/06
no abstracts in English
; Ozawa, K.; ;
JAERI-M 86-127, 76 Pages, 1986/08
no abstracts in English
)
}
ZnBr;
Journal of the Physical Society of Japan, 54(11), p.4205 - 4212, 1985/00
Times Cited Count：8 Percentile：61.80(Physics, Multidisciplinary)no abstracts in English
Sasuga, Tsuneo; Kawanishi, Shuichi; Takehisa, Masaaki
J.Phys.Chem., 88(15), p.3326 - 3329, 1984/00
no abstracts in English
ZnIJournal of the Physical Society of Japan, 53(11), p.3850 - 3854, 1984/00
Times Cited Count：11 Percentile：68.51(Physics, Multidisciplinary)no abstracts in English
; ;
Nucl.Fnsion, 24(1), p.13 - 31, 1984/00
Times Cited Count：51 Percentile：80.47(Physics, Fluids & Plasmas)no abstracts in English
)}MnBrJournal of the Physical Society of Japan, 52(8), p.2931 - 2935, 1983/00
Times Cited Count：40 Percentile：88.65(Physics, Multidisciplinary)no abstracts in English
-irradiation and heatSasuga, Tsuneo; Seguchi, Tadao; Arakawa, Kazuo; Hayakawa, Naohiro
EIM-82-118, p.19 - 27, 1982/00
no abstracts in English
SO at 56K; ;
Ferroelectrics Letters, 44, p.71 - 75, 1982/00
Times Cited Count：12 Percentile：53.58(Physics, Condensed Matter)no abstracts in English
・NHFerroelectrics Letters, 44, p.63 - 70, 1982/00
no abstracts in English
H(SeO) and RbD(SeO) at low temperatureJournal of the Physical Society of Japan, 50(10), p.3185 - 3186, 1981/00
Times Cited Count：50 Percentile：91.50(Physics, Multidisciplinary)no abstracts in English
ZnIJournal of the Physical Society of Japan, 50(11), p.3535 - 3536, 1981/00
Times Cited Count：34 Percentile：92.15(Physics, Multidisciplinary)no abstracts in English
