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論文

Hard X-ray photoelectron spectroscopy study for transport behavior of CsI in heating test simulating a BWR severe accident condition; Chemical effects of boron vapors

岡根 哲夫; 小畠 雅明; 佐藤 勇*; 小林 啓介*; 逢坂 正彦; 山上 浩志

Nuclear Engineering and Design, 297, p.251 - 256, 2016/02

 被引用回数:1 パーセンタイル:14.27(Nuclear Science & Technology)

Transport behavior of CsI in the heating test, which simulated a BWR severe accident, was investigated by hard X-ray photoelectron spectroscopy (HAXPES) with an emphasis on the chemical effect of boron vapors. CsI deposited on metal tube at temperatures ranging from 150$$^{circ}$$C to 750$$^{circ}$$C was reacted with vapor/aerosol B$$_2$$O$$_3$$, and the chemical form of reaction products on the sample surface was examined from the HAXPES spectra of core levels, e.g., Ni 2p, Cs 3d and I 3d levels, and valence band. For the samples at $$sim$$300$$^{circ}$$C, while the chemical form of major product on the sample surface without an exposure to B$$_2$$O$$_3$$ was suggested to be CsI from the HAXPES spectra, an intensity ratio of Cs/I was dramatically reduced at the sample surface after the reaction with B$$_2$$O$$_3$$. The results suggest the possibility of significant decomposition of deposited CsI induced by the chemical reaction with B$$_2$$O$$_3$$ at specific temperatures.

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