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Tsai, Y. H.*; 小畠 雅明; 福田 竜生; 谷田 肇; 小林 徹; 山下 良之*
Applied Physics Letters, 124(11), p.112105_1 - 112105_5, 2024/03
被引用回数:1 パーセンタイル:0.00(Physics, Applied)Recently, gallium oxide (GaO) has attracted much attention as an ultra-wide bandgap semiconductor with a bandgap of about 5 eV. In order to control device properties, it is important to clarify the chemical state of dopants and doping sites. X-ray absorption near edge structure (XANES) and hard X-ray photoemission spectroscopy were used to investigate the dopant sites and chemical states of Sn in Sn-doped -GaO(001) samples. The results show that the chemical state of the Sn dopant is the Sn oxidation state and that the bond lengths around the Sn dopant atoms are longer due to the relaxation effect after Sn dopant insertion. Comparison of experimental and simulated XANES spectra indicates that the octahedral Ga substitution site in -GaO(001) is the active site of the Sn dopant.