Carrier removal and defect generation in lattice-mismatched InGaP under 1 MeV electron irradiation

Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; Oshima, Takeshi; Kamiya, Tomihiro

no abstracts in English

Language	:	English
Journal	:	Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
Volume	:
Number	:
Pages	:	p.87 - 91
Publication Year/Month	:	2004/10
Meeting title	:	6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
Held date	:	2004/10
Location (city)	:	Tsukuba
Location (country)	:	Japan
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DOI for research data	:
Keywords	:	格子不整合系InGaP太陽電池; 電子線照射; 分光感度; キャリア濃度; キャリア減少率; 短絡電流
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Article of JAEA R&D Review	:
Cooperating Institute	:	豊田工業大学

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Registration No. : B20041364
JAEA Abstracts No. : 330447
Paper Submission No. : 21779

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