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Residual stress estimation of Ag-sheathed Bi2223 tapes using Neutron and X-ray diffraction

Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Ayai, Naoki*; Kato, Takeshi*; Hayashi, Kazuhiko*; Sato, Kenichi*

no abstracts in English

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