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Measurement of internal strain in materials using high energy white X-ray at SPring-8

SPring-8の高エネルギー白色X線を用いた材料内部ひずみ測定

柴野 純一*; 菖蒲 敬久; 鈴木 賢治*; 桐山 幸治; 梶原 堅太郎*; 金子 洋; 小林 道明*

Shibano, Junichi*; Shobu, Takahisa; Suzuki, Kenji*; Kiriyama, Koji; Kajiwara, Kentaro*; Kaneko, Hiroshi; Kobayashi, Michiaki*

In this paper, the strain in the bulk of material was measured using high energy white X-rays from synchrotron radiation sources of BL14B1 and BL28B2 at SPring-8 in Japan. JIS-S45C carbon steel and JIS-SHY685 high-tensile steel were used as specimens. As a result, the internal strain of SHY685 of 15 millimeters thickness could be evaluated using X-rays with energy of 155 keV diffracted by $$alpha$$-Fe321 lattice plane. It is suitable for the high accuracy measurement to include more than or equal to 5000 grains of crystal in the gauge volume. Furthermore, the measurement error peak count and the profile which is close to Gaussian curve. However, the measurement accuracy of the internal strain of S45C was relatively low. Because the diffracted X-ray peak counts at each measurement position fluctuated with the relationship between grain size of S45C and the irradiated X-ray beam size.

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