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Elemental sensitivity in soft X-ray imaging with a laser-plasma source and a color center detector

レーザープラズマ源とカラーセンター検出器を用いたX線イメージにおける基本的な感度

Calegari, F.*; Valentini, G.*; Vozzi, C.*; Benedetti, E.*; Cabanillas-Gonzalez, J.*; Faenov, A. Y.; Gasilov, S.*; Pikuz, T.*; Poletto, L.*; Sansone, G.*; Villoresi, P.*; Nisoli, M.*; De Silvestri, S.*; Stagira, S.*

Calegari, F.*; Valentini, G.*; Vozzi, C.*; Benedetti, E.*; Cabanillas-Gonzalez, J.*; Faenov, A. Y.; Gasilov, S.*; Pikuz, T.*; Poletto, L.*; Sansone, G.*; Villoresi, P.*; Nisoli, M.*; De Silvestri, S.*; Stagira, S.*

Elemental sensitivity in soft X-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft X-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.

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パーセンタイル:24.08

分野:Optics

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