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Sedimentation of impurity atoms in InSb semiconductor under a strong gravitational field

超重力場下におけるInSb半導体中での不純物原子の沈降

井口 裕介*; 小野 正雄  ; 岡安 悟  ; 真下 茂

Iguchi, Yusuke*; Ono, Masao; Okayasu, Satoru; Mashimo, Tsutomu

これまでに、合金や化合物に100万Gレベルの超重力場を加えることで、構成原子の沈降現象を誘起し、原子スケールの傾斜構造の形成に成功してきた。本研究では、超重力場下の半導体中での不純物原子の沈降について調べた。試料はGeを物理蒸着(PVD)したInSb単結晶ウエハーとし、超重力場実験条件は、最大遠心加速度59万G,超重力場実験としては比較的高温の400$$^{circ}$$Cの試料温度にて、60時間とした。超重力場処理したGeの侵入深さが、地上重力場下で同一温度で熱処理した場合に比べ数倍深くなっていることがわかった。

An atomic-scale graded structure has been formed by sedimentation of substitutional atoms under an ultra-strong gravitational field of 1 million G level in alloys and compounds. In this study, we investigate the sedimentation of impurity atoms in semiconductor materials under a strong gravitational field. High-temperature ultracentrifuge experiments (0.59$$times$$10$$^{6}$$ G, 400$$^{circ}$$C, 60 hours) have been performed on an InSb single crystal wafer which surface was coated with Ge by means of Physical Vapor Deposition (PVD). It was observed that the penetration depth of diffused Ge atoms under the gravitational field was several times larger than under terrestrial field at the same temperatures.

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