Thermal degradation analysis of deuterium ion implanted hydrogen storage material (TiFe and VCrTi) using synchrotron radiation photoelectron spectroscopy

放射光光電子分光による重水素イオン注入した水素貯蔵材料(TiFe and VCrTi)の熱変性分析

戸出 真由美; Harries, J.; 寺岡 有殿; 吉越 章隆 

Tode, Mayumi; Harries, J.; Teraoka, Yuden; Yoshigoe, Akitaka

水素の脱離温度特性と表面皮膜の関連を研究するために、熱処理による表面皮膜の変性過程を高分解能軟X線放射光光電子分光法で観測した。実験はSPring-8の原子力機構専用軟X線ビームライン(BL23SU)に設置した表面反応分析装置(SUREAC2000)を用いて行った。試料は373Kから1073Kでフラッシュアニール後に室温で測定を行った。自然酸化膜付きのVCrTiと、自然酸化膜上から重水素イオンを注入したVCrTiのSR-XPS測定を行った。重水素化したTiFeは酸化膜が変質し始める温度が200Cから250C下がった。重水素化したVCrTiは自然酸化膜の熱変性温度が上昇した。

In order to study the relationships between the thermal desorption of hydrogen and the surface properties, we have used high-resolution synchrotron radiation X-ray photoelectron spectroscopy to study the thermal degeneration processes of the surface layers. The experiments were performed at the JAEA soft X-ray beamline BL23SU at SPring-8, using the "SUREAC2000" surface reaction analysis apparatus. XPS spectra were recorded for room temperature TiFe and VCrTi following flash heating to 373-1073 K. Spectra were recorded for two samples covered with native oxide layers, one of which was implanted with deuterium ions. In the deuterium-implanted TiFe, the temperature to which it begins to resolve the oxide component has lowered at about 200-250 C. On the other hand, in VCrTi, the thermal stability of a surface natural oxide layer has increased by the deuterium-implanted.