Sorption / diffusion data aquisition method development for high sorbing americium in compacted bentonite

Ishii, Yasuo; Takahashi, Hiroaki; Tachi, Yukio  ; Tomura, Tsutomu*; Nemoto, Kazuaki*; Okazaki, Mitsuhiro*

Am(III) diffusion experiment were performed by reservoir depletion (RD) test method coupled with thin layer ID profile fitting in 0.1 or 0.5M NaCl / 0.05M NaHCO - bentonite (kunipia-F) system. The Kd values were also measured using batch technique in the same experimental conditions. In an ordinary ID profile acquisition cutting the bentonite by scraper, the compacted bentonite sample can be cut into 100 m thick slices. Using this technique, it was possible to divide the ID profile into 10 m and therefore, to analyze diffusion distance layer larger than 50 m.