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Optical features of a LiF crystal soft X-ray imaging detector irradiated by free electron laser pulses

自由電子レーザーで照射されたLiF結晶の軟X線イメージングの光学特性

Pikuz, T.; Faenov, A.*; 福田 祐仁; 神門 正城; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; 永園 充*; 大橋 治彦*; 矢橋 牧名*; 登野 健介*; 仙波 泰徳*; 富樫 格*; 石川 哲也*

Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; Tono, Kensuke*; Semba, Yasunori*; Togashi, Tadashi*; Ishikawa, Tetsuya*

Optical features of point defects photoluminescence in LiF crystals, irradiated by soft X-ray pulses of the Free Electron Laser were measured. We found that peak of photoluminescence spectra lies near of 530 nm. Our results suggest that redistribution of photoluminescence peak intensity from red to green part of the spectra is associated with a shortening of the applied for irradiation of LiF laser pulses down to pico - or femtosecond durations. Dependence of peak intensity of photoluminescence spectra from the soft X-ray irradiation fluence was measured and the absence of quenching phenomena, even at relatively high fluencies was found, which is very important for wide applications of LiF crystal X-ray imaging detectors.

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パーセンタイル:75.12

分野:Optics

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