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論文

Optical features of a LiF crystal soft X-ray imaging detector irradiated by free electron laser pulses

Pikuz, T.; Faenov, A.*; 福田 祐仁; 神門 正城; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; 永園 充*; 大橋 治彦*; 矢橋 牧名*; et al.

Optics Express (Internet), 20(4), p.3424 - 3433, 2012/02

 被引用回数:22 パーセンタイル:75.12(Optics)

Optical features of point defects photoluminescence in LiF crystals, irradiated by soft X-ray pulses of the Free Electron Laser were measured. We found that peak of photoluminescence spectra lies near of 530 nm. Our results suggest that redistribution of photoluminescence peak intensity from red to green part of the spectra is associated with a shortening of the applied for irradiation of LiF laser pulses down to pico - or femtosecond durations. Dependence of peak intensity of photoluminescence spectra from the soft X-ray irradiation fluence was measured and the absence of quenching phenomena, even at relatively high fluencies was found, which is very important for wide applications of LiF crystal X-ray imaging detectors.

口頭

The Near field and far field in situ characterization of soft X-ray laser beam by submicron-resolution LiF crystal X-ray detector

Faenov, A.*; Pikuz, T.; 福田 祐仁; 田中 桃子; 岸本 牧; 石野 雅彦; 錦野 将元; 神門 正城; 河内 哲哉; 永園 充*; et al.

no journal, , 

It was demonstrate high quality, single - shot in situ imaging of the near field and the far field intensity distribution of laser-driven transient-collision plasma and free electron soft X-ray lasers (SXRL) beams with 700 nm spatial resolution by color center formation in LiF crystals. The method based on diffraction of SXRL beams on the periodical structures and registration of diffracted patterns by LiF X-ray detector is proposed. It is demonstrated experimentally and by modeling that such approach allows measuring the intensity, coherence and spectral distribution of SXRL beam across the beam with high accuracy.

口頭

Characterizing the soft X-ray laser beams by submicron-resolution LiF detector

Pikuz, T.; Faenov, A.*; 福田 祐仁; 田中 桃子; 石野 雅彦; 長谷川 登; 錦野 将元; 大橋 治彦*; 矢橋 牧名*; 登野 健介*; et al.

no journal, , 

Review of results, obtained by using recently proposed new imaging detector, based on formation of color centers in LiF crystal and LiF film, for in situ high performance measurements of near-field and far-field properties of soft X-ray lasers (SXRL) beams is presented. Experiments have been carried out with laser-driven transient-collision plasma SXRL, free electron SXRL, and relativistic HOH beams. It was demonstrated that due to favorable combination of high spatial resolution, high dynamic range and wide field of view, that this technique allows measuring not only intensity distribution across the full beam and in local areas with resolution of $$sim$$ 700 nm, but also allows to evaluate coherence and spectral distribution of radiation across the beam. Experimental diffraction patterns in the images of periodical structures are analyzed by comparison with the modeled ones in the last case. Good agreement between experimental and modeling data was obtained.

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