A Chemical-state-specific study of the composition of the natural oxide layer of VCrTi

化学結合状態を選別したVCrTiの自然酸化膜の化学組成の研究

Harries, J.; 寺岡 有殿; 戸出 真由美; 吉越 章隆 

Harries, J.; Teraoka, Yuden; Tode, Mayumi; Yoshigoe, Akitaka

Angle-resolved photoelectron spectroscopy is an established technique for obtaining information on the depth-dependence of the concentration of elements within a sample. When synchrotron radiation is used as the X-ray source, the high flux and high energy resolution allow chemical-state specific information to be obtained - an area where the technique has advantages over more quantitative techniques with higher depth resolution. Here we describe the application of the technique at the surface chemistry end-station at BL23SU, SPring-8, where thin films can be analysed in situ. The technique is applied to studying the natural oxide surface layer of VCrTi, a hydrogen-storage material.