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Depth-resolved XMCD spectroscopy on single-layer graphene / Ni structure

単層グラフェン/Ni構造の深さ分解X線磁気円二色性分光

松本 吉弘; 圓谷 志郎; 大伴 真名歩; Avramov, P.; 楢本 洋*; 雨宮 健太*; 境 誠司

Matsumoto, Yoshihiro; Entani, Shiro; Otomo, Manabu; Avramov, P.; Naramoto, Hiroshi*; Amemiya, Kenta*; Sakai, Seiji

The graphene-metal interaction is not only of fundamental interest but also of technological importance in view of spintronic applications. For the purpose of clarifying the electronic and magnetic states of graphene / ferromagnetic metal structure, depth-resolved X-ray absorption and X-ray magnetic circular dichroism (XMCD) spectroscopy are performed on the single- and bi-layer graphene /Ni(111) structures. An intense XMCD signal is observed in the C K-edge XMCD spectrum taken under the surface sensitive condition. This indicates that there exists the Ni-induced spin polarization in the $$pi$$-orbitals of graphene even at room temperature. The depth-resolved analysis of the Ni L-edge XMCD spectrum makes clear that the magnetization of Ni is decreased by 20-30% within a few atomic layers from the interface with single-layer graphen, possibly associated with the formation of C-Ni bonds.

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