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Interface structures and electronic states of Si$$_{2}$$/Si in oxidation processes of Si high index surfaces

Abe, Sosuke*; Ono, Shinya*; Kanemura, Rui*; Yoshigoe, Akitaka ; Teraoka, Yuden; Ogata, Shoichi*; Yasuda, Tetsuji*; Tanaka, Masatoshi*

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