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Change in electrical properties SiC-MOS capacitor and PiN diode after $$gamma$$ ray irradiation

Tanaka, Kazuya*; Yokoseki, Takashi*; Fujita, Natsuko   ; Iwamoto, Naoya; Makino, Takahiro; Onoda, Shinobu; Oshima, Takeshi; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; Hijikata, Yasuto*

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