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Synchrotron radiation-based M$"o$ssbauer spectra of $$^{174}$$Yb measured with internal conversion electrons

内部転換電子で測定する$$^{174}$$Yb放射光メスバウアースペクトル

増田 亮*; 小林 康浩*; 北尾 真司*; 黒葛 真行*; 齋藤 真器名*; 依田 芳卓*; 三井 隆也; 伊賀 文俊*; 瀬戸 誠

Masuda, Ryo*; Kobayashi, Yasuhiro*; Kitao, Shinji*; Kurokuzu, Masayuki*; Saito, Makina*; Yoda, Yoshitaka*; Mitsui, Takaya; Iga, Fumitoshi*; Seto, Makoto

本研究では、核共鳴吸収に伴うX線と電子を同時に検出できる検出器を備えた装置を世界に先駆けて開発し、その装置と大型放射光施設SPring-8の大強度X線を用いて、YbB$$_{12}$$に含まれる$$^{174}$$Ybの放射光メスバウアースペクトルを測定することに成功した。今後、さまざまな元素の放射光メスバウアー測定が可能になり、レアアース磁石などの磁石材料や錯体・触媒材料・エレクトロニクス材料といった機能性材料の研究に進展がもたらされることが期待できる。本研究の一部は科学研究費補助金・基盤研究S「同位体特定による局所状態解明のための先進的メスバウアー分光法開発」及び研究スタート支援「放射光を用いたネオジム核共鳴散乱法の開発」の補助を受け、SPring-8の利用課題として行われた。

A detection system for synchrotron-radiation (SR)-based M$"o$ssbauer spectroscopy was developed to enhance the nuclear resonant scattering counting rate and thus increase the available nuclides. In the system, a windowless avalanche photodiode (APD) detector was combined with a vacuum cryostat to detect the internal conversion (IC) electrons and fluorescent X-rays accompanied by nuclear de-excitation. As a feasibility study, the SR-based M$"o$ssbauer spectrum using the 76.5 keV level of $$^{174}$$Yb was observed without $$^{174}$$Yb enrichment of the samples. The counting rate was five times higher than that of our previous system, and the spectrum was obtained within 10 h. This result shows that nuclear resonance events can be more efficiently detected by counting IC electrons for nuclides with high IC coefficients. Furthermore, the windowless detection system enables us to place the sample closer to the APD elements and is advantageous for nuclear resonant inelastic scattering measurements. Therefore, this detection system can not only increase the number of nuclides accessible in SR-based M$"o$ssbauer spectroscopy but also allows the nuclear resonant inelastic scattering measurements of small single crystals or enzymes with dilute probe nuclides that are difficult to measure with the previous detection system.

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パーセンタイル:45.24

分野:Physics, Applied

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