Developments of a JT-60SA Thomson scattering diagnostic

JT-60SAトムソン散乱計測開発の進展

東條 寛; 波多江 仰紀; 佐久間 猛; 濱野 隆; 伊丹 潔; 水藤 哲*; 荒木 高士*; 岩本 耕平*; 武田 裕也*

Tojo, Hiroshi; Hatae, Takaki; Sakuma, Takeshi; Hamano, Takashi; Itami, Kiyoshi; Suito, Satoshi*; Araki, Takashi*; Iwamoto, Kohei*; Takeda, Yuya*

JT-60SA Thomson scattering diagnostic will provide profiles of electron temperature and density. This presentation shows developments of a YAG laser system and calibration methods, and designs of collection optics and vacuum windows. For the collection optics to be used for the core measurements, refraction system with five lenses is employed. Dispersing focusing power over multiple lenses enable utilizing radiation resistant lenses. Because the entrance pupil is located inside the lenses, the incident light flux can be efficiently focused using compact lens (diameter 225 mm). The resolution for the image is about 0.6 mm, which is almost the same specification of a previous lens design using four lenses. More than 50% of total transmissivity can be achieved over 480-1064 nm wavelength range: thereby making measurements of high electron temperature ( 30 keV) possible.