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X-ray backscattering study of crystal lattice distortion in hidden order of URu$$_2$$Si$$_2$$

URu$$_2$$Si$$_2$$の隠れた秩序相における結晶格子変形のX線背面反射による研究

田端 千紘*; 稲見 俊哉; 道村 真司*; 横山 淳*; 日高 宏之*; 柳澤 達也*; 網塚 浩*

Tabata, Chihiro*; Inami, Toshiya; Michimura, Shinji*; Yokoyama, Makoto*; Hidaka, Hiroyuki*; Yanagisawa, Tatsuya*; Amitsuka, Hiroshi*

We performed synchrotron X-ray diffraction measurements on a small single crystal of URu$$_2$$Si$$_2$$. A backscattering diffraction setup (2$$thetasim179.81^circ$$) in combination with a Si(6 6 0) monochromator ensures a high instrumental resolution of $$Delta d/d sim 7.3 times 10^{-6}$$, where $$d$$ denotes a lattice-plane spacing and $$Delta d$$ is its spread expressed as the full width at half maximum (FWHM). We carefully measured the (5 5 0) Bragg peak in the temperature range between 5 and 25 K, and found it to show no signature of broadening and splitting when "Hidden Order (HO)" sets in below 17.5 K. Temperature variation of the peak position closely follows the behaviour of the known linear thermal expansion coefficient. Detailed analysis of the peak width reveals that the tetragonal fourfold rotational symmetry of URu$$_2$$Si$$_2$$ is conserved in HO within the experimental accuracy of the orthorhombicity of $$|b-a|/(b+a)leq3.0times10^{-5}$$.

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パーセンタイル:35.64

分野:Materials Science, Multidisciplinary

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