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epitaxial thin filmsNakano, Masaki*; Wang, Y.*; Yoshida, Satoshi*; Matsuoka, Hideki*; Majima, Yuki*; Ikeda, Keisuke*; Hirata, Yasuyuki*; Takeda, Yukiharu; Wadachi, Hiroki*; Kohama, Yoshimitsu*; et al.
Nano Letters, 19(12), p.8806 - 8810, 2019/12
Times Cited Count：57 Percentile：92.26(Chemistry, Multidisciplinary)Nakamura, Hironobu; Shimizu, Yasuyuki; Makino, Risa; Mukai, Yasunobu; Ishiyama, Koichi; Kurita, Tsutomu; Ikeda, Atsushi*; Yamaguchi, Katsuhiro*
Proceedings of INMM 57th Annual Meeting (Internet), 9 Pages, 2016/07
Regarding the Integrated Safeguards (IS) in Japan, the implementation of IS has been started on September 2004, and the concept has been introduced to the JNC-1 facilities since August 2008. Then, random interim inspection with short notice and reducing person-days of inspection (PDI) was introduced instead of traditional scheduled IIV in order to improve deterrence of the nuclear material diversion with timeliness goal. And it was agreed that it should be evaluated and reviewed because RII was designed when inter-campaign. In JAEA, we decided to restart PCDF campaign to reduce potential safety risks of reprocessing facilities. To adopt the RII scheme to the process operation in campaign, JAEA proposed a new scheme to JSGO and IAEA without increasing PDI and reducing detection probability. As a result of the discussion, it was agreed and successfully introduced since March 2014. The new scheme for PCDF consists of scheduled inspection (fixed-day RII), reduction of estimated material for the verification, implementation of remote monitoring with data provision, improvement of operational status check list, introduction of NRTA and MC&A data declaration with timeliness. Though the operator's workloads for information provision were increased, we could manage to balance IS requirement with implementation of our operation successfully. This contribution was helped to safeguards implementation and our operation for 2 years.
Makino, Risa; Swinhoe, M. T.*; Suzuki, Hisanori; Ikeda, Atsushi*; Menlove, H. O.*; Shimizu, Yasuyuki; Nakamura, Hironobu
Kaku Busshitsu Kanri Gakkai (INMM) Nihon Shibu Dai-35-Kai Nenji Taikai Rombunshu (Internet), 9 Pages, 2015/01
The Inventory Verification Sample system (INVS) is a non-destructive assay system for samples to quantify the Pu amount in Pu nitrate solutions and MOX with 31.3% of counting efficiency. It has been used for IAEA verification measurement for many years at the Plutonium Conversion Development Facility for the samples taken at the timing of PIV etc. as a partial defects verification system (uncertainty: about 3-5%). If the measurement uncertainty can be improved (to 
1%), it is expected that the usage can be extended to the operator's own measurements in MC&A to reduce the number of destructive analyses. In order to improve the measurement uncertainty for solution samples, after optimization of detector parameter and sample position, we conducted 3 different types of calibration method that is passive calibration curve, known-
and multiplicity method to achieve the target uncertainty. To perform calibration and control the measurement quality, MOX fuel pellets with known Pu amount are fabricated and used. In the range of concentration of typical solution samples, we could confirm good correlations between measured doubles and 
Pu effective mass in the three methods. Especially, it was confirmed that the conventional calibration curve method could meet our target uncertainty (1%).
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; Fukaya, Yuki; et al.
European Physical Journal D, 66(2), p.37 - 40, 2012/02
Times Cited Count：38 Percentile：85.09(Optics)no abstracts in English
collisions at 
= 200 and 62.4 GeVAdare, A.*; Afanasiev, S.*; Aidala, C.*; Ajitanand, N. N.*; Akiba, Yasuyuki*; Al-Bataineh, H.*; Alexander, J.*; Aoki, Kazuya*; Aphecetche, L.*; Armendariz, R.*; et al.
Physical Review C, 83(6), p.064903_1 - 064903_29, 2011/06
Times Cited Count：184 Percentile：99.42(Physics, Nuclear)Transverse momentum distributions and yields for 
, and 
in collisions at = 200 and 62.4 GeV at midrapidity are measured by the PHENIX experiment at the RHIC. We present the inverse slope parameter, mean transverse momentum, and yield per unit rapidity at each energy, and compare them to other measurements at different collisions. We also present the scaling properties such as 
and 
scaling and discuss the mechanism of the particle production in collisions. The measured spectra are compared to next-to-leading order perturbative QCD calculations.
and Au+Au collisions at 
= 200 GeVAdare, A.*; Afanasiev, S.*; Aidala, C.*; Ajitanand, N. N.*; Akiba, Yasuyuki*; Al-Bataineh, H.*; Alexander, J.*; Aoki, Kazuya*; Aphecetche, L.*; Aramaki, Y.*; et al.
Physical Review C, 83(4), p.044912_1 - 044912_16, 2011/04
Times Cited Count：9 Percentile：52.86(Physics, Nuclear)Measurements of electrons from the decay of open-heavy-flavor mesons have shown that the yields are suppressed in Au+Au collisions compared to expectations from binary-scaled collisions. Here we extend these studies to two particle correlations where one particle is an electron from the decay of a heavy flavor meson and the other is a charged hadron from either the decay of the heavy meson or from jet fragmentation. These measurements provide more detailed information about the interaction between heavy quarks and the quark-gluon matter. We find the away-side-jet shape and yield to be modified in Au+Au collisions compared to collisions.
Co 
-raysIkeda, Shigetoshi*; Kasai, Noboru; ; ; Haruyama, Yasuyuki; Seguchi, Tadao
JAERI-Tech 99-005, 37 Pages, 1999/02
no abstracts in English
Nakada, Masami; ; Saeki, Masakatsu; Aratono, Yasuyuki; Ikeda, Yujiro;
SIF Conf. Proc., Vol. 50 (ICAME-95), 0, p.99 - 102, 1996/00
no abstracts in English
Haruyama, Yasuyuki; ; Ikeda, Shigetoshi*; Sunaga, Hiromi; Takizawa, Haruki; Seguchi, Tadao
JAERI-Tech 95-003, 18 Pages, 1995/02
no abstracts in English
Aoyama, Yoshio; Yamaguchi, Hiromi; Sakakibara, Tetsuro; Hanamoto, Yukio; Murata, Minoru*; Sasaki, Nao*; Nishikawa, Tsutomu*; Taniguchi, Shoji*; Shimazaki, Shinichi*; Park, J.*; et al.
no journal, ,
no abstracts in English
Aoyama, Yoshio; Yamaguchi, Hiromi; Sakakibara, Tetsuro; Hanamoto, Yukio; Murata, Minoru*; Sasaki, Nao*; Nishikawa, Tsutomu*; Taniguchi, Shoji*; Shimazaki, Shinichi*; Park, J.*; et al.
no journal, ,
no abstracts in English
Yamaguchi, Hiromi; Miyamoto, Yasuaki; Sakakibara, Tetsuro; Hanamoto, Yukio; Aoyama, Yoshio; Sasaki, Nao*; Nishikawa, Tsutomu*; Murata, Minoru*; Muroi, Masayuki*; Park, J.*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Mochizuki, Izumi*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Nigorikawa, Kazuyuki*; Shidara, Tetsuo*; Osawa, Satoshi*; Ikeda, Mitsuo*; Shirakawa, Akihiro*; et al.
no journal, ,
no abstracts in English
Yamaguchi, Hiromi; Miyamoto, Yasuaki; Sakakibara, Tetsuro; Hanamoto, Yukio; Aoyama, Yoshio; Sasaki, Nao*; Nishikawa, Tsutomu*; Murata, Minoru*; Muroi, Masayuki*; Park, J.*; et al.
no journal, ,
no abstracts in English
Aoyama, Yoshio; Yamaguchi, Hiromi; Miyamoto, Yasuaki; Sakakibara, Tetsuro; Hanamoto, Yukio; Sasaki, Nao*; Nishikawa, Tsutomu*; Murata, Minoru*; Muroi, Masayuki*; Park, J.*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Suzuki, Ryohei*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Suwada, Tsuyoshi*; Furukawa, Kazuro*; Shirakawa, Akihiro*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Mochizuki, Izumi*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Shidara, Tetsuo*; Osawa, Satoshi*; Ikeda, Mitsuo*; Shirakawa, Akihiro*; Furukawa, Kazuro*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Mochizuki, Izumi*; Hyodo, Toshio*; Shidara, Tetsuo*; Osawa, Satoshi*; Ikeda, Mitsuo*; Michishio, Koji*; Terabe, Hiroki*; Iida, Shimpei*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
