Update of fire receiver panel (The Waste Safety Testing Facility)

Hatakeyama, Yuichi; Hirai, Koki; Ikegami, Yuta*; Sano, Naruto; Tomita, Takeshi; Usami, Koji; Tagami, Susumu

JAEA-Technology 2024-020, 33 Pages, 2025/03

JAEA-Technology-2024-020.pdf:2.21MB

The Waste Safety Testing Facility (WASTEF) is a facility that began operation in December 1982 with the aim of conducting safety testing research on the long-term storage and subsequent geological disposal of high-level radioactive waste generated by the reprocessing of spent fuel. This facility is composed of five concrete cells, one lead cell, six glove boxes, and seven hoods, and is a large-scale facility capable of using nuclear fuel materials including uranium and plutonium, as well as radioisotopes such as neptunium and americium. The facility is equipped with an automatic fire alarm system for the entire building in accordance with the Fire Service Act and regulations on technical standards for facilities used. This is an important aspect of safety management, and it is required that the equipment be sufficiently sound and reliable. However, after more than 30 years of use since its installation, the fire receiving panel, one of the components of the automatic fire alarm system, has deteriorated significantly. Furthermore, many of the parts used have been discontinued and are no longer available, making it difficult to procure them, making it difficult to maintain the equipment's performance. Therefore, in order to ensure the safe and stable operation of WASTEF, the fire receiving panel was updated. This report summarizes the update of the fire receiving panel among the automatic fire alarm equipment that was implemented in FY2022.

Density and X-ray emission profile relationships in highly ionized high-Z laser-produced plasmas

Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; Hirose, Ryoichi*; et al.

Applied Physics Letters, 106(12), p.121109_1 - 121109_5, 2015/03

https://doi.org/10.1063/1.4916395

Time-resolved soft X-ray imaging of femtosecond laser ablation process in metals

Tomita, Takuro*; Nishikino, Masaharu; Hasegawa, Noboru; Minami, Yasuo*; Takei, Ryota*; Baba, Motoyoshi*; Eyama, Tsuyoshi*; Takayoshi, Shodai*; Kaihori, Takeshi*; Morita, Toshimasa; et al.

Journal of Laser Micro/Nanoengineering, 9(2), p.137 - 142, 2014/06

https://doi.org/10.2961/jlmn.2014.02.0011

Femtosecond laser ablation processes on platinum, gold, and tungsten were observed by the single shot pump and probe reflective imaging using a soft X-ray laser probe. To avoid the timing error due to the jitter, we adopted a posteriori correction technique by simultaneous measurement of timing between the pump and probe pulses for every single shot, using a soft X-ray streak camera. A clear difference was found in the temporal behavior of the dynamical response of the soft X-ray reflectivity depending on the irradiated laser fluence in these three materials. On the other hand, the narrow dark rings were found in Pt and W, while an additional bright ring was found outside the dark disk in Au. Our result gives the experimental data comparable with various numerical simulations.

Temperature dependence of electric conductivities in femtosecond laser modified areas in silicon carbide

Deki, Manato*; Oka, Tomoki*; Takayoshi, Shodai*; Naoi, Yoshiki*; Makino, Takahiro; Oshima, Takeshi; Tomita, Takuro*

Materials Science Forum, 778-780, p.661 - 664, 2014/02

https://doi.org/10.4028/www.scientific.net/MSF.778-780.661

no abstracts in English

Breakdown voltage in silicon carbide metal-oxide-semiconductor devices induced by ion beams

Oshima, Takeshi; Deki, Manato; Makino, Takahiro; Iwamoto, Naoya; Onoda, Shinobu; Hirao, Toshio*; Kojima, Kazutoshi*; Tomita, Takuro*; Matsuo, Shigeki*; Hashimoto, Shuichi*

AIP Conference Proceedings 1525, p.654 - 658, 2013/04

https://doi.org/10.1063/1.4802408

Metal-Oxide-Semiconductor (MOS) capacitors were fabricated on n-type 4H-SiC epitaxial layers, and the leakage current through the gate oxide during heavy ion irradiation was investigated in order to evaluate dielectric breakdown induced by heavy ions (Single Event Gate Rupture: SEGR). The gate oxide at thickness ranges between 60 and 80 nm was formed using pyrogenic oxidation at 1100 C for 60 min. Circular electrodes with 180 diameter were formed using Al evaporation and a lift-off technique. The leakage current observed through the gate oxide was monitored during 18 MeV oxygen (O) or nickel (Ni) ions. As a result, although no significant difference in the value of the electric field at the dielectric breakdown (around 8.2 MV/cm) was observed between non-irradiated and 18 MeV-O irradiated samples, the value decreased to be 7.3 MV/cm in the case of 18 MeV-Ni ion incidence. The Linier Energy Transfer (LET) for 18 MeV-O is 7 MeV cm/mg, and this value is smaller than that for 18 MeV-Ni (24 MeV cm/mg). Also, 18 MeV-Ni ions deposit energy in narrower regions than 18 MeV-O ions. Thus, it can be concluded that the high density of charge induced by 18 MeV-Ni ions triggers SEGR in SiC MOS capacitors.

Experimental verification of femtosecond laser ablation schemes by time-resolved soft X-ray reflective imaging

Tomita, Takuro*; Yamamoto, Minoru*; Hasegawa, Noboru; Terakawa, Kota*; Minami, Yasuo*; Nishikino, Masaharu; Ishino, Masahiko; Kaihori, Takeshi*; Ochi, Yoshihiro; Kawachi, Tetsuya; et al.

Optics Express (Internet), 20(28), p.29329 - 29337, 2012/12

https://doi.org/10.1364/OE.20.029329

Pump and probe reflective imaging using a soft X-ray laser probe was applied to the observation of the early stage of femtosecond laser ablation process on platinum. In strongly excited area, drastic and fast reflectivity drop was observed. In moderately excited area, the decay of the reflectivity is slower than that in the strongly excited area, and the reflectivity reaches its minimum at t = 160 ps. In weakly excited area, laser-induced reflectivity change was not observed. These results give the critical information about the femtosecond laser ablation.

Development of remote controlled electron probe micro analyzer with crystal orientation analyzer

Honda, Junichi; Matsui, Hiroki; Harada, Akio; Obata, Hiroki; Tomita, Takeshi

JAEA-Technology 2012-022, 35 Pages, 2012/07

JAEA-Technology-2012-022.pdf:3.58MB

The advanced utilization of Light Water Reactor (LWR) fuel is progressed in Japan to save the power generating cost and the volume of nuclear wastes. The electric power companies have been continued the approach to extend the burnup and to rise up the thermal power of the commercial fuel. The government should be accumulating the detailed information of the newest technologies to make the regulations and guidelines for the safety of the advanced nuclear fuels. The remote controlled Electron Prove Micro Analyzer attached with crystal orientation analyzer (EPMA) has been developed in Japan Atomic Energy Agency (JAEA) to evaluate the fuel behavior effected by the cladding microstructure under the accident condition. The device was modified to the airtight and earthquake resistant structure for the examination of high radioactive elements. This paper describes the specification of EPMA and the test results of the cold mock-up to confirm their performances and reliabilities.

Development of the X-ray interferometer and the method of spatial and temporal synchronization of XRL and optical pulse

Hasegawa, Noboru; Ochi, Yoshihiro; Kawachi, Tetsuya; Terakawa, Kota*; Tomita, Takuro*; Yamamoto, Minoru; Nishikino, Masaharu; Oba, Toshiyuki; Kaihori, Takeshi; Imazono, Takashi; et al.

X-Ray Lasers 2010; Springer Proceedings in Physics, Vol.136, p.353 - 358, 2011/12

http://ci.nii.ac.jp/ncid/BB05543208

The understanding of the dynamics of the initial process is important for the micro processing and welding by the ultra-short laser pulse. The X-ray laser is suitable for probing this initial process because it has short wavelength (Ni-like Ag, 13.9 nm) and short duration (7 ps). For this investigation, the origin of time of the pumping pulse is quite important. In this study, we used the scintillation plate and the plasma gate technique to realize the spatial and temporal synchronization of the pump and probe pulses. For the spatial alignment, a CsI scintillation plate that was set at the sample position was illuminated by both the X-ray laser pulse, and the fluorescence light were detected by the CCD camera. For the temporal synchronization, we set a thin foil at the sample position. We measured the transmission of the X-ray laser while changing a temporal delay of the pumping laser with respect to the time of X-ray laser pulse to obtain the origin of the irradiation time.

Observation of the laser-induced surface dynamics by the single-shot X-ray laser interferometer

Hasegawa, Noboru; Ochi, Yoshihiro; Kawachi, Tetsuya; Nishikino, Masaharu; Ishino, Masahiko; Imazono, Takashi; Kaihori, Takeshi; Sasaki, Akira; Terakawa, Kota*; Minami, Yasuo*; et al.

Proceedings of SPIE, Vol.8140, p.81400G_1 - 81400G_8, 2011/10

https://doi.org/10.1117/12.893442

We have developed a soft X-ray laser (SXRL) interferometer capable of the single-shot imaging of nano-scaled structure dynamics. The interferometer consisted of the reflection optics including double Lloyd's mirrors and focusing optics, and the interference fringes are produced on the detector surface. By using this interferometer, the initial stage (50 ps) of the ablation process of the Pt surface pumped by a 70 fs Ti:Sapphire laser pulse was observed. The expansion speed of the surface estimated from the result (34 nm/50 ps) indicated that the nano-bubble structures were formed in the initial stage of the ablation. In order to observe the detailed dynamics, the temporal synchronization between the pump and probe pulses was improved to be 3 ps by adopting a portion of the SXRL and pump beams as the time fiducials, to which the pump and probe timing was adjusted by using the X-ray streak camera.

Observation of femtosecond laser ablation process by using the soft X-ray laser interferometer

Yamamoto, Minoru; Hasegawa, Noboru; Terakawa, Kota*; Umeda, Yoshifumi*; Tomita, Takuro*; Ochi, Yoshihiro; Nishikino, Masaharu; Ishino, Masahiko; Imazono, Takashi; Kaihori, Takeshi; et al.

Proceedings of 12th International Symposium on Laser Precision Microfabrication (LPM 2011) (Internet), 4 Pages, 2011/06

Femtosecond lasers have been used for material processing. However, the physical processes responsible for femtosecond laser ablation have not been understood completely. These processes involve melting, vaporization, re-solidification or ablation, which occur in a very short time from pico- to nano-seconds. To understand the physical processes, it is essential to reveal the dynamics of ultrafast surface morphological change after laser irradiation. At JAEA, the laser-driven plasma soft X-ray laser (SXRL) that has extremely high spatial and spectral purity was constructed. It delivers soft X-ray photons at 89.2 eV (13.9 nm) with a photon number of exceeding , which is sufficient to obtain a single shot interferogram. By using this system, the soft X-ray laser interferometer with the lateral resolution of 1.8 m and a depth resolution of 1 nm was developed. We report on demonstration of time-resolved measurement of femtosecond-laser ablation dynamics by using the soft X-ray laser interferometer.