Chemical form analysis of reaction products in Cs-adsorption on stainless steel by means of HAXPES and SEM/EDX

Kobata, Masaaki; Okane, Tetsuo; Nakajima, Kunihisa; Suzuki, Eriko; Owada, Kenji; Kobayashi, Keisuke*; Yamagami, Hiroshi; Osaka, Masahiko

Journal of Nuclear Materials, 498, p.387 - 394, 2018/01

https://doi.org/10.1016/j.jnucmat.2017.10.035

In this study, for the understandings of Cesium (Cs) adsorption behavior on structure materials in severe accidents at a light water nuclear reactor, the chemical state of Cs and its distribution on the surface of SUS304 stainless steel (SS) with different Si concentration were investigated by hard X-ray photoelectron spectroscopy (HAXPES) and scanning electron microscope / energy dispersive X-ray spectroscopy (SEM/EDX). As a result, it was found that Cs is selectively adsorbed at the site where Si distributes with high concentration. CsFeSiO is a dominant Cs products in the case of low Si content, mainly formed, while CsSiO and CsSiO are formed in addition to CsFeSiO in the case of high Si content. The chemical forms of the Cs compounds produced in the adsorption process on the SS surface has a close correlation with the concentration and chemical states of Si originally included in SS.

Electronic structure of EuAl studied by photoelectron spectroscopy

Kobata, Masaaki; Fujimori, Shinichi; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; Kobayashi, Keisuke*; Yamagami, Hiroshi; Nakamura, Ai*; Hedo, Masato*; Nakama, Takao*; et al.

Journal of the Physical Society of Japan, 85(9), p.094703_1 - 094703_6, 2016/09

https://doi.org/10.7566/JPSJ.85.094703

Study of oxide film with the hard X-ray photoelectron spectroscopy

Kobata, Masaaki; Kobayashi, Keisuke*

Journal of the Vacuum Society of Japan, 58(2), p.43 - 49, 2015/02

https://doi.org/10.3131/jvsj2.58.43

We report the applications of a hard X-ray photoelectron spectroscopy to the characterization of SiO/Si(001)systems. Large escape depth of high-energy photoelectron enables us to probe buried layers and their interfaces in multilayer structures. Estimation of SiO overlayer thicknesses up to 25 nm by angle resolved XPS was possible in SiO/Si(001) samples. Determination of the thickness profile of a wedged shape SiO buried layer was successfully done in Ir (8 nm)/HfO (2.2 nm)/thickness graded-SiO (0-10 nm) / Si (100). The Si 1s core level showed a SiO thickness dependent shift, which was ascribed to fixed charge at the SiO-Si interface. Energy distribution of interface states at ultrathin thermal oxide/Si(100) interfaces were determined by Si 1 core level shift by applying gate bias in metal-oxide-semiconductor (MOS) structure with 5 nm Au gate electrodes.

Role of residual transition-metal atoms in oxygen reduction reaction in cobalt phthalocyanine-based carbon cathode catalysts for polymer electrolyte fuel cell

Kobayashi, Masaki*; Niwa, Hideharu*; Harada, Yoshihisa*; Horiba, Koji*; Oshima, Masaharu*; Ofuchi, Hironori*; Terakura, Kiyoyuki*; Ikeda, Takashi; Koshigoe, Yuka*; Ozaki, Junichi*; et al.

Journal of Power Sources, 196(20), p.8346 - 8351, 2011/10

https://doi.org/10.1016/j.jpowsour.2011.06.062

The electronic structure of Co atoms in CoPc-based carbon catalysts, which were prepared by pyrolyzing a mixture of CoPc and phenol resin polymer up to 1000C, has been investigated using XAFS analysis and HXPES. The Co K XAFS spectra show that most of the Co atoms are in the metallic state and small quantities of oxidized Co components are present in the samples even after acid washing to remove Co atoms. Based on the difference in probing depth between XAFS and HXPES, it was found that after acid washing, the surface region with the aggregated Co clusters is primarily composed of metallic Co. Since the electrochemical properties remain almost unchanged even after the acid washing process, the residual metallic and oxidized Co atoms themselves will hardly contribute to the ORR activity of the CoPc-based carbon cathode catalysts, implying that the active sites of the CoPc-based catalysts primarily consist of light elements such as C and N.

X-ray photoemission spectroscopy analysis of N-containing carbon-based cathode catalysts for polymer electrolyte fuel cells

Niwa, Hideharu*; Kobayashi, Masaki*; Horiba, Koji*; Harada, Yoshihisa*; Oshima, Masaharu*; Terakura, Kiyoyuki*; Ikeda, Takashi; Koshigoe, Yuka*; Ozaki, Junichi*; Miyata, Seizo*; et al.

Journal of Power Sources, 196(3), p.1006 - 1011, 2011/02

https://doi.org/10.1016/j.jpowsour.2010.08.054

We report on the electronic structure of three different types of N-containing carbon-based cathode catalysts for polymer electrolyte fuel cells observed by hard X-ray photoemission spectroscopy. C 1s spectra show the importance of carbon network formation for the oxygen reduction reaction (ORR) activity. Samples having high oxygen reduction reaction activity in terms of oxygen reduction potential contain high concentration of graphite-like nitrogen. Based on a quantitative analysis of our results, the oxygen reduction reaction activity of the carbon-based cathode catalysts will be improved by increasing concentration of graphite-like nitrogen in a developed carbon network.

Antiferromagnetic interaction between paramagnetic Co ions in the diluted magnetic semiconductor ZnCoO

Kobayashi, Masaki*; Ishida, Yukiaki*; Hwang, J. I.*; Osafune, Yoshitaka*; Fujimori, Atsushi*; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; Kobayashi, Keisuke*; Saeki, Hiromasa*; et al.

Physical Review B, 81(7), p.075204_1 - 075204_7, 2010/02

AA2009-0975.pdf:0.87MB

https://doi.org/10.1103/PhysRevB.81.075204

Nature of magnetic coupling between Mn ions in as-grown GaMnAs studied by X-ray magnetic circular dichroism

Takeda, Yukiharu; Kobayashi, Masaki*; Okane, Tetsuo; Okochi, Takuo*; Okamoto, Jun*; Saito, Yuji; Kobayashi, Keisuke*; Yamagami, Hiroshi; Fujimori, Atsushi*; Tanaka, Arata*; et al.

Hoshako, 22(4), p.202 - 209, 2009/07

http://ci.nii.ac.jp/naid/10025009601

no abstracts in English

Mutation induction in azalea seedlings using ion beam irradiation

Kobayashi, Nobuo*; Tasaki, Keisuke*; Kano, Sayaka*; Sakamoto, Sakiko*; Nakatsuka, Akira*; Hase, Yoshihiro; Narumi, Issei

JAEA-Review 2008-055, JAEA Takasaki Annual Report 2007, P. 70, 2008/11

https://jopss.jaea.go.jp/pdfdata/JAEA-Review-2008-055.pdf

no abstracts in English

Local electronic structure of Cr in the II-VI diluted ferromagnetic semiconductor ZnCrTe

Kobayashi, Masaki*; Ishida, Yukiaki*; Hwang, J. I.*; Song, G. S.*; Fujimori, Atsushi; Yang, C. S.*; Lee, L.*; Lin, H.-J.*; Huang, D.-J.*; Chen, C. T.*; et al.

New Journal of Physics (Internet), 10, p.055011_1 - 055011_15, 2008/05

https://doi.org/10.1088/1367-2630/10/5/055011

Phase change observed in ultrathin BaSrTiO films by in situ resonant photoemission spectroscopy

Lin, Y.-H.*; Terai, Kota*; Wadachi, Hiroki*; Kobayashi, Masaki*; Takizawa, Masaru*; Hwang, J. I.*; Fujimori, Atsushi; Nan, C.-W.*; Li, J.-F.*; Fujimori, Shinichi; et al.

Applied Physics Letters, 90(22), p.222909_1 - 222909_3, 2007/05

AA2007-0754.pdf:0.58MB

https://doi.org/10.1063/1.2745249

Epitaxial BaSrTiO thin films were prepared on Nb-doped SrTiO (100) substrates by the pulsed laser deposition technique and were studied by measuring the Ti 2p 3d resonant photoemission spectra in the valence-band region, both at room temperature and low temperature. The results demonstrated an abrupt variation in the spectral structures between 2.8 nm (7 ML) and 2.0 nm (5 ML) BaSrTiO films, suggesting that there exists a critical thickness for phase change in the range of 2.0-2.8 nm.