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Screening of uranium particles by total-reflection X-ray fluorescence spectrometry for safeguards environmental sample analysis

全反射蛍光X線分析法による保障措置環境試料分析のためのウラン粒子のスクリーニング

江坂 文孝; 渡部 和男; 間柄 正明; 半澤 有希子; 臼田 重和

Esaka, Fumitaka; Watanabe, Kazuo; Magara, Masaaki; Hanzawa, Yukiko; Usuda, Shigekazu

保障措置環境試料分析における粒子分析のためのスクリーニング技術の開発を目的として、全反射蛍光X線分析法の有効性を検討した。まず、相対感度係数及び検出限界について調べた結果、ウランの検出限界は、0.4ngであった。さらに実試料へ適用した結果、全反射蛍光X線分析法の保障措置環境試料分析のためのスクリーニング法としての有効性が示された。

The capability of total-reflection X-ray fluorescence spectrometry (TXRF) technique was studied to screen a swipe sample for uranium content, which was employed to decide on the further isotopic ratio measurements by secondary ion mass spectrometry (SIMS) for safeguards environmental sample analysis. A part of the measurement system of TXRF was modified to be able to use the same glassy carbon carrier for SIMS analysis. Particles in the swipe sample were recovered on the carbon carrier. The relative sensitivities of 11 elements including uranium were determined using selenium as an internal standard. The detection limit of uranium was 0.4 ng. The screening technique studied was applied to the practical swipe samples taken from the laboratories. The results confirm that TXRF can be a promising screening technique for uranium in swipe samples for safeguards environmental sample analysis.

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パーセンタイル:79.65

分野:Chemistry, Analytical

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