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液体金属・半導体の圧力誘起構造変化と化学結合性

Effects of chemical bonding character on pressure-induced structural changes of liquid metals and semiconductors

服部 高典; 辻 和彦*

Hattori, Takanori; Tsuji, Kazuhiko*

四配位共有結合性物質の液体の圧力誘起構造変化を、放射光を用いたX線回折実験によって調べた。その結果、それらの液体は化学結合の共有結合性/イオン性によってさまざまな構造変化を示すことがわかった。すなわち、イオン性の小さな物質(液体GaSb, InSb, InAS等)は、数十万気圧に渡るきわめて広い圧力領域に渡って構造変化するのに対し、イオン性の大きな物質(液体CdTe, AgI等)は、数万気圧という比較的狭い圧力範囲で構造変化が終了する。本稿では、これらの結果をイオン性が与える局所構造の安定性という点から議論する。

We investigate pressure-induced structural changes in liquids of tetrahedrally bonded materials by a synchrotron X-ray diffraction. The liquids show various structural changes, depending on their ionic characters in the chemical bonds. The liquids with a small ionic character, such as GaSb, InSb, InAs, show continuous structural changes over a wide pressure region of about 20 GPa. In contrast, those with a large ionic character, such as CdTe, AgI, show drastic structural changes within a narrow pressure region of $$sim$$ 2 GPa. We discuss the effect of the ionicity on the pressure-induced structural changes in liquid and compare the effect with that in the crystalline phases.

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