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放射光X線光電子分光を用いた超熱酸素分子線に誘起されるNiTi表面酸化過程の解明

Synchrotron X-ray photoemission study of NiTi surface oxidation with hyperthermal oxygen molecular beam

山崎 大地*; 宗和 誠*; 岡田 美智雄*; 寺岡 有殿; 笠井 俊夫*

Yamazaki, Daichi*; Sowa, Makoto*; Okada, Michio*; Teraoka, Yuden; Kasai, Toshio*

Dtailed studies on the initial oxidation process of NiTi with a 2 eV hyperthermal oxygen molecular beam (HOMB) and thermal O$$_{2}$$ in the backfilling have been conducted. The oxidation processes are monitored by X-ray photoemission spectroscopic measurements in conjunction with synchrotron radiation. In the oxide formation process at higher oxygen coverage, HOMB has the advantage in the dissociation process of O$$_{2}$$ molecule and can grow TiO$$_{2}$$ layers with the underlying TiO$$_{x}$$-rich and/or Ni-rich layers even at room temperature. Surface annealing enhances the diffusion atoms and as a result, the efficiency of Ti oxide formation. We succeeded in fabricating thick Ni-free TiO$$_{2}$$ layer, possibly blue colored rutile TiO$$_{2}$$, combining HOMB and surface annealing.

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