Research of the radiation tolerance in space environment of general electronic devices

宇宙環境における一般の電子デバイスの放射線耐性の調査

前田 高広*; 垣見 征孝*; 明石 健二*; 大島 武; 小野田 忍

Maeda, Takahiro*; Kakimi, Yukitaka*; Akashi, Kenji*; Oshima, Takeshi; Onoda, Shinobu

In order to develop a small satellite, the general electronic (Commercial Of The Self: COTS) devices have to be used because of some severe restrictions of resource for installed components. For this reason, it is important to evaluate the reliability of COTS devices. Therefore, the various type of heavy ions have been irradiated to COTS devices. We have evaluated the probability of Single Event Effects (SEEs) in COTS devices. Finally we predicted the occurrence of SEEs when COTS devices are brought to orbit. As a result, we found that COTS devices tested here have enough reliability for the mission of our small satellite.