Domain structure and electronic state in P3HT:PCBM blend thin films by soft X-ray resonant scattering

有機太陽電池P3HT:PCBM薄膜の構造と電子状態に関する放射光を用いた研究

久保田 正人 ; 櫻井 岳暁*; 宮寺 哲彦*; 中尾 裕則*; 杉田 武*; 吉田 郵司*

Kubota, Masato; Sakurai, Takeaki*; Miyadera, Tetsuhiko*; Nakao, Hironori*; Sugita, Takeshi*; Yoshida, Yuji*

有機薄膜太陽電池を高効率化するためには、適切なドメイン構造形成、並びにその物性評価が重要である。2成分有機分子凝集系の有機太陽電池薄膜で見られる構造や電子状態の特徴を捉えるために、成膜過程に用いる溶媒を変えた試料の放射光実験を行った。ドメインが成長し、分子自体の配向度が高い方が機能性が高いという特徴があることを明らかにした。

We performed soft X-ray resonant scattering experiments on P3HT:PCBM blend thin films to reveal the domain structure and electronic state, where P3HT and PCBM mean regioregular poly (3-hexylthiophene) and [6,6]-phenyl-C61-buteric acid methyl ester, respectively. We measured two films, where chloroform (CF sample) and 1,2-dichlorobenzene (DCB sample) are used as solvents in the fabrication process. There is negligible X-ray incident angle dependence of the X-ray absorption spectra at the S -absorption edge in the CF sample, whereas the DCB sample exhibits clear incident angle dependence. We obtained the wave-number resolved spectra at = (1, 0, 0) for P3HT molecules in both samples. The packing growth of P3HT molecules is revealed to be much more developed in the DCB sample than the CF sample. In addition, the electronic structure at local sulfur element sites clearly changes for both of the samples.