Synchrotron XPS analysis of Cs in vermiculite and Cs compounds

Cs含有バーミキュライト及びCs化合物の放射光XPS分析

Teraoka, Yuden; Yoshigoe, Akitaka; Okada, Ryuta; Iwai, Yutaro*

Photoemission spectroscopy with synchrotron radiation has been applied to analyze Cs atoms soaked in vermiculite crystals and Cs compounds. Core level photoemission spectra (Cs 3d $_{5/2}$ peak) and Auger electron spectra (Cs N $_{4}$ M $_{45}$ M $_{45}$ Auger peak) could be measured so that modified Auger parameters could be estimated. The parameters were estimated by adding the photon energy to the kinetic energy difference of the Cs N $_{4}$ M $_{45}$ M $_{45}$ Auger peak and the Cs 3d $_{5/2}$ photoemission peak. The estimated modified Auger parameter of Cs in vermiculite is ranging from 1292.9 eV to 1293.3 eV. This range is close to that of CsBr (1293.1-1294.1 eV), CsNO $_{3}$ (1293.4-1294.0 eV), and CsClO $_{4}$ (1292.8 eV), whereas that of CsI (1295.1-1295.8 eV) is clearly far from it. The modified Auger parameters of CsCO $_{3}$ (1295.3 eV), CsOH (1294.4 eV), and Cs $_{2}$ SO $_{4}$ (1295.3-1295.7 eV) are different from the range of Cs-vermiculite in our measurements.

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発表会議名	:	6th International Symposium on Practical Surface Analysis
開催年月	:	2013/11
開催都市	:	Ginowan
開催国	:	Japan
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