検索対象:     
報告書番号:
※ 半角英数字
 年 ~  年

Measurements of $$gamma$$-ray emission probabilities of $$^{241,243}$$Am and $$^{239}$$Np

$$^{241,243}$$Am及び$$^{239}$$Npの崩壊$$gamma$$線放出率の測定

寺田 和司; 中村 詔司; 中尾 太郎; 木村 敦; 岩本 修; 原田 秀郎 ; 高宮 幸一*; 堀 順一*

Terada, Kazushi; Nakamura, Shoji; Nakao, Taro; Kimura, Atsushi; Iwamoto, Osamu; Harada, Hideo; Takamiya, Koichi*; Hori, Junichi*

$$^{241,243}$$Am及び$$^{239}$$Npの崩壊$$gamma$$線放出率の高精度測定を実施した。測定試料の放射能は、試料から放出される$$alpha$$粒子をSi半導体検出器で測定することで決定した。そして、$$gamma$$線はプレナ型のHPGe検出器で測定した。Ge検出器の検出効率は標準$$gamma$$線源の測定とPHITSを用いた光子の輸送計算から、50-1332keVのエネルギー領域で0.7%, 50keV以下の領域では1.3%の精度で決定した。最終的に、$$^{241,243}$$Am及び$$^{239}$$Npの主要な崩壊$$gamma$$線放出率を1.2%の精度で得ることができた。

$$gamma$$-ray emission probabilities of $$^{241,243}$$Am and $$^{239}$$Np have been precisely measured with $$gamma$$- and $$alpha$$-ray spectroscopic methods. The activities of $$^{243}$$Am samples were determined by measuring alpha particles using a Si semiconductor detector. $$gamma$$-rays emitted from the samples were measured with a planar type High-Purity Germanium (HPGe) detector. An efficiency curve of the Ge detector was derived with uncertainties of 0.7% from 50 to 1332 keV and 1.3% below 50 keV by combining measured efficiencies and Monte Carlo simulation. The $$gamma$$-ray emission probabilities for the major $$gamma$$-rays of these nuclides were determined with uncertainties less than 1.2%.

Access

:

- Accesses

InCites™

:

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.