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Measurements of $$gamma$$-ray emission probabilities of $$^{241,243}$$Am and $$^{239}$$Np

$$^{241,243}$$Am及び$$^{239}$$Npの崩壊$$gamma$$線放出率の測定

寺田 和司; 中村 詔司  ; 中尾 太郎; 木村 敦   ; 岩本 修  ; 原田 秀郎   ; 高宮 幸一*; 堀 順一*

Terada, Kazushi; Nakamura, Shoji; Nakao, Taro; Kimura, Atsushi; Iwamoto, Osamu; Harada, Hideo; Takamiya, Koichi*; Hori, Junichi*

$$^{241,243}$$Am及び$$^{239}$$Npの崩壊$$gamma$$線放出率の高精度測定を実施した。測定試料の放射能は、試料から放出される$$alpha$$粒子をSi半導体検出器で測定することで決定した。そして、$$gamma$$線はプレナ型のHPGe検出器で測定した。Ge検出器の検出効率は標準$$gamma$$線源の測定とPHITSを用いた光子の輸送計算から、50-1332keVのエネルギー領域で0.7%, 50keV以下の領域では1.3%の精度で決定した。最終的に、$$^{241,243}$$Am及び$$^{239}$$Npの主要な崩壊$$gamma$$線放出率を1.2%の精度で得ることができた。

$$gamma$$-ray emission probabilities of $$^{241,243}$$Am and $$^{239}$$Np have been precisely measured with $$gamma$$- and $$alpha$$-ray spectroscopic methods. The activities of $$^{243}$$Am samples were determined by measuring alpha particles using a Si semiconductor detector. $$gamma$$-rays emitted from the samples were measured with a planar type High-Purity Germanium (HPGe) detector. An efficiency curve of the Ge detector was derived with uncertainties of 0.7% from 50 to 1332 keV and 1.3% below 50 keV by combining measured efficiencies and Monte Carlo simulation. The $$gamma$$-ray emission probabilities for the major $$gamma$$-rays of these nuclides were determined with uncertainties less than 1.2%.

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パーセンタイル:28.38

分野:Nuclear Science & Technology

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