3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector
Pikuz, T.*; Faenov, A.*; 松岡 健之*; 松山 智至*; 山内 和人*; 尾崎 典雅*; Albertazzi, B.*; 犬伏 雄一*; 矢橋 牧名*; 登野 健介*; 佐藤 祐哉*; 湯本 博勝*; 大橋 治彦*; Pikuz, S.*; Grum-Grzhimailo, A. N.*; 錦野 将元; 河内 哲哉; 石川 哲也*; 児玉 了祐*
Pikuz, T.*; Faenov, A.*; Matsuoka, Takeshi*; Matsuyama, Satoshi*; Yamauchi, Kazuto*; Ozaki, Narimasa*; Albertazzi, B.*; Inubushi, Yuichi*; Yabashi, Makina*; Tono, Kensuke*; Sato, Yuya*; Yumoto, Hirokatsu*; Ohashi, Haruhiko*; Pikuz, S.*; Grum-Grzhimailo, A. N.*; Nishikino, Masaharu; Kawachi, Tetsuya; Ishikawa, Tetsuya*; Kodama, Ryosuke*
we report, that by means of direct irradiation of lithium fluoride a (LiF) crystal, in situ 3D visualization of the SACLA XFEL focused beam profile along the propagation direction is realized, including propagation inside photoluminescence solid matter. High sensitivity and large dynamic range of the LiF crystal detector allowed measurements of the intensity distribution of the beam at distances far from the best focus as well as near the best focus and evaluation of XFEL source size and beam quality factor M2. Our measurements also support the theoretical prediction that for X-ray photons with energies 10 keV the radius of the generated photoelectron cloud within the LiF crystal reaches about 600 nm before thermalization. The proposed method has a spatial resolution 0.4-2.0 micron for photons with energies 6-14 keV and potentially could be used in a single shot mode for optimization of different focusing systems developed at XFEL and synchrotron facilities.