Modulation of Dirac electrons in epitaxial Bi
Se
ultrathin films on van der Waals ferromagnet Cr
Si
Te
ファンデルワールス強磁性体Cr
Si
Te
上のエピタキシャルBi
Se
超薄膜におけるディラック電子の変調
加藤 剛臣*; 菅原 克明*; 伊東 直洋*; 山内 邦彦*; 佐藤 匠*; 小口 多美夫*; 高橋 隆*; 塩見 雄毅*; 齊藤 英治; 佐藤 宇史*
Kato, Takemi*; Sugawara, Katsuaki*; Ito, Naohiro*; Yamauchi, Kunihiko*; Sato, Takumi*; Oguchi, Tamio*; Takahashi, Takashi*; Shiomi, Yuki*; Saito, Eiji; Sato, Takafumi*
We investigated the Dirac-cone state and its modulation when an ultrathin film of topological insulator Bi
Se
was epitaxially grown on a van der Waals ferromagnet Cr
Si
Te
(CST) by angle-resolved photoemission spectroscopy. We observed a gapless Dirac-cone surface state in six quintuple-layer (6QL) Bi
Se
on CST, whereas the Dirac cone exhibits a gap of 0.37 eV in its 2QL counterpart. Intriguingly, this gap is much larger than those for Bi
Se
films on Si(111). We also revealed no discernible change in the gap magnitude across the ferromagnetic transition of CST, suggesting the very small characteristic length and energy scale of the magnetic proximity effect. The present results suggest a crucial role of interfacial coupling for modulating Dirac electrons in topological-insulator hybrids.