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Matrix-material dependence on the elongation of embedded gold nanoparticles induced by 4 MeV C$$_{60}$$ and 200 MeV Xe ion irradiation

Li, R.*; 鳴海 一雅*; 千葉 敦也*; 平野 優*; 津谷 大樹*; 山本 春也*; 斎藤 勇一*; 大久保 成彰; 石川 法人; Pang, C.*; et al.

Nanotechnology, 31(26), p.265606_1 - 265606_9, 2020/06

 被引用回数:1 パーセンタイル:24.67(Nanoscience & Nanotechnology)

材料中に埋め込まれた金ナノ粒子に4MeV C$$_{60}$$イオンと200MeV Xeイオンを照射した時の伸長変形現象について、3つの材料(アモルファスカーボン,CaF$$_{2}$$,結晶酸化インジウムスズ(ITO))について調べ、その材料依存性を調べた。どの材料についても、イオン照射に伴って結晶性を失う傾向が見られた。ITOが、最も金ナノ粒子の変形が顕著であり、かつ照射後にもかかわらず結晶性を保っていた。結晶性の材料において金ナノ粒子の変形を報告する初めて報告例となる。


Ecological and genomic profiling of anaerobic methane-oxidizing archaea in a deep granitic environment

伊能 康平*; Hernsdorf, A. W.*; 今野 祐多*; 幸塚 麻里子*; 柳川 克則*; 加藤 信吾*; 砂村 道成*; 広田 秋成*; 東郷 洋子*; 伊藤 一誠*; et al.

ISME Journal, 12(1), p.31 - 47, 2018/01

 被引用回数:30 パーセンタイル:93.55(Ecology)



Age and speciation of iodine in groundwater and mudstones of the Horonobe area, Hokkaido, Japan; Implications for the origin and migration of iodine during basin evolution

東郷 洋子*; 高橋 嘉夫*; 天野 由記; 松崎 浩之*; 鈴木 庸平*; 寺田 靖子*; 村松 康行*; 伊藤 一誠*; 岩月 輝希

Geochimica et Cosmochimica Acta, 191, p.165 - 186, 2016/10

 被引用回数:13 パーセンタイル:60.45(Geochemistry & Geophysics)



Deep microbial life in high-quality granitic groundwater from geochemically and geographically distinct underground boreholes

伊能 康平*; 今野 祐多*; 幸塚 麻里子*; 廣田 明成*; 東郷 洋子*; 福田 朱里*; 小松 大介*; 角皆 潤*; 田辺 章文*; 山本 智*; et al.

Environmental Microbiology Reports (Internet), 8(2), p.285 - 294, 2016/04

 被引用回数:18 パーセンタイル:67.66(Environmental Sciences)

瑞浪超深地層研究所の深度300mの花崗岩中の地下水を対象として、ボーリング孔を利用した微生物特性の調査を行った。ボーリング孔から得られた地下水は、当初、好気性の水素酸化に関わるHydrogenophaga spp.が優勢種であったが、3年後にはNitrospirae門の微生物が優勢種となった。後者の微生物種は系統学的に深部地下水や陸域の温泉水において観察される種であり、この地域の土着の微生物種と考えられた。


Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C$$_{60}^{3+}$$ impacts

北山 巧*; 中嶋 薫*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 松田 誠; 左高 正雄*; 辻本 将彦*; 磯田 正二*; 木村 健二*

Nuclear Instruments and Methods in Physics Research B, 354, p.183 - 186, 2015/07

 被引用回数:2 パーセンタイル:22.25(Instruments & Instrumentation)

According to an inelastic-thermal-spike (i-TS) model, which is regarded as the most promising among several models proposed to explain the formation of an ion track, a part of the energy deposited to electrons in a solid by a swift heavy ion is gradually transferred to target atoms via electron-phonon coupling. The temperature of target atoms rises along the ion path and consequently an ion track is formed when the temperature exceeds the melting point. Therefore, the temperature of target atoms along the ion path is regarded as a key parameter for the i-TS model; however, such a spatiotemporally-localized temperature is difficult to measure because the processes involved occur in a very short period ($$<$$ 10$$^{-10}$$ s) and in a very localized area. In this study, the temperature of target atoms along the ion path is estimated experimentally with transmission-electron-microscope (TEM) observation of desorption of Au nanoclusters (the melting point $$sim$$1300 K) on an amorphous Si$$_{3}$$N$$_{4}$$ thin film under 1.1-MeV C$$_{60}^{3+}$$-ion irradiation to the fluence of $$sim$$5$$times$$10$$^{10}$$ ions/cm$$^{2}$$. TEM images show that Au nanoclusters, deposited at the areal density of 1.16$$times$$10$$^{12}$$ particles/cm$$^{2}$$, disappear in a surface area with a diameter of $$sim$$20 nm around each ion track, whose diameter is $$sim$$4 nm, after irradiation. This indicates that the temperature at the film surface rises locally to at least 1300 K by the ion bombardment.


Biogeochemical signals from deep microbial life in terrestrial crust

鈴木 庸平*; 今野 祐多*; 福田 朱里*; 小松 大介*; 廣田 明成*; 渡邊 勝明*; 東郷 洋子*; 森川 徳敏*; 萩原 大樹; 青才 大介*; et al.

PLOS ONE (Internet), 9(12), p.e113063_1 - e113063_20, 2014/12

 被引用回数:9 パーセンタイル:36.08(Multidisciplinary Sciences)



Sputtering of SiN films by 540 keV C$$_{60}$$$$^{2+}$$ ions observed using high-resolution Rutherford backscattering spectroscopy

中嶋 薫*; 森田 陽亮*; 北山 巧*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 辻本 将彦*; 磯田 正二*; 藤居 義和*; 木村 健二*

Nuclear Instruments and Methods in Physics Research B, 332, p.117 - 121, 2014/08

 被引用回数:7 パーセンタイル:55.77(Instruments & Instrumentation)

Our previous observation that an impact of sub-MeV C$$_{60}$$ ion makes an ion track in a thin amorphous silicon nitride (a-SiN) film suggests emission of thousands of atoms from the cylindrical region. Sputtering yields of a-SiN films by C$$_{60}$$ ions were evaluated in order to confirm this observation. A-SiN films deposited on Si(001) were irradiated with 540-keV C$$_{60}$$$$^{2+}$$ ions at fluences from 2.5$$times$$10$$^{11}$$ to 1$$times$$10$$^{14}$$ ions/cm$$^{2}$$. The compositional depth profiles of the irradiated samples were measured with high-resolution Rutherford backscattering spectroscopy, and the sputtering yields were estimated at 3900 $$pm$$ 500 N atoms/ion and 1500 $$pm$$ 1000 Si atoms/ion. The sputtering yield of N was two orders of magnitude larger than the elastic sputtering yield by the SRIM code or than the measured electronic sputtering yield of a-SiN by 50-MeV Cu ions previously reported. Such a large sputtering yield cannot be explained either by the elastic sputtering or by the electronic sputtering. However, an estimation of the synergistic effect based on the inelastic thermal spike model roughly explains the observed large sputtering yield, indicating that the synergistic effect of the nuclear and electronic stopping powers plays an important role.


Transmission secondary ion mass spectrometry using 5 MeV C$$_{60}$$$$^{+}$$ ions

中嶋 薫*; 永野 賢悟*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 平田 浩一*; 木村 健二*

Applied Physics Letters, 104(11), p.114103_1 - 114103_4, 2014/03

 被引用回数:5 パーセンタイル:26.55(Physics, Applied)

In the secondary ion mass spectrometry (SIMS), use of cluster ions has an advantage of having a high sensitivity of intact large molecular ions over monatomic ions. This paper presents further yield enhancement of the intact biomolecular ions with measuring the secondary ions emitted from a self-supporting thin film in the forward direction, which is the same direction as primary beams. Phenylalanine amino-acid films deposited on self-supporting thin Si$$_{3}$$N$$_{4}$$ films were bombarded with 5-MeV C$$_{60}$$$$^{+}$$ ions. Secondary ions emitted in the forward and backward directions were measured under the bombardments of the SiN and phenylalanine sides, respectively. The yield of intact phenylalanine molecular ions emitted in the forward direction is about one order of magnitude larger than the backward direction, while fragment ions of phenylalanine molecules are suppressed. This suggests a large potential of transmission cluster-ion SIMS for the analysis of biological materials.


Coulomb explosion process in collision of a swift cluster ion with gas target

千葉 敦也; 鳴海 一雅; 山田 圭介; 的場 史朗; 齋藤 勇一

JAEA-Review 2013-059, JAEA Takasaki Annual Report 2012, P. 167, 2014/03



Quantitative evaluation of charge-reduction effect in cluster constituent ions passing through a foil

千葉 敦也; 齋藤 勇一; 鳴海 一雅; 山田 圭介; 金子 敏明*

Nuclear Instruments and Methods in Physics Research B, 315, p.81 - 84, 2013/11

 被引用回数:0 パーセンタイル:0.01(Instruments & Instrumentation)



Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅

Nuclear Instruments and Methods in Physics Research B, 314, p.39 - 42, 2013/11

 被引用回数:3 パーセンタイル:29.69(Instruments & Instrumentation)

Secondary ion mass spectrometry (SIMS) is one of the most powerful tools for surface analysis. Use of a time-of-flight (TOF) mass spectrometry for SIMS is advantageous in efficiently detecting secondary ions at a wider range of mass to charge ratio. We have studied on TOF-SIMS utilizing cluster ions as primary ions. Their Energy dependence to the yield of secondary ions from organic thin films was obtained in the energy range up to MeV order. As a result, it was revealed that the secondary-ion yields for organic material increased with increasing incident cluster energy in the range. This shows that cluster impacts with the energy range of up to MeV order are useful in TOF-SIMS to be applied to the high sensitive analysis of surface for organic materials.


Surface effect on ion track formation in amorphous Si$$_{3}$$N$$_{4}$$ films

森田 陽亮*; 中嶋 薫*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 石川 法人; 北條 喜一; 辻本 将彦*; 磯田 正二*; 木村 健二*

Nuclear Instruments and Methods in Physics Research B, 315, p.142 - 145, 2013/11

 被引用回数:8 パーセンタイル:59.34(Instruments & Instrumentation)

Thin films of amorphous Si$$_{3}$$N$$_{4}$$ (thickness 5-30 nm) were irradiated with 360-720 keV C$$_{60}$$$$^{2+}$$ ions in order to investigate ion track formation. Ion tracks were observed with transmission electron microscopy (TEM) and high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM). The length and the radial density profile of the track were measured for various combinations of the film thickness and the energy of C$$_{60}$$$$^{2+}$$ ions. The length of the ion track produced in a 30-nm film was found shorter than that in a 20-nm film for the same projectile energy, which indicates that there is surface effect on track formation. This can be qualitatively understood in terms of the energy dissipation process. The observed radial density profile also depends on the film thickness: The apparent density reduction increases with decreasing film thickness. The result can be explained by surface cratering.


Transmission properties of C$$_{60}$$ ions through micro- and nano-capillaries

土田 秀次*; 間嶋 拓也*; 冨田 成夫*; 笹 公和*; 鳴海 一雅; 齋藤 勇一; 千葉 敦也; 山田 圭介; 平田 浩一*; 柴田 裕実*; et al.

Nuclear Instruments and Methods in Physics Research B, 315, p.336 - 340, 2013/11

 被引用回数:3 パーセンタイル:29.69(Instruments & Instrumentation)

Applying the beam-focusing method with capillaries to C$$_{60}$$ projectiles in the velocity range between 0.14 and 0.2 a.u., transmission properties of C$$_{60}$$ ions through two different types of capillaries are studied: (1) a borosilicate-glass single microcapillary with an outlet diameter of 5.5 $$mu$$m, and (2) an Al$$_{2}$$O$$_{3}$$ multicapillary foil with approximatey 70-nm pores in diameter and a high aspect ratio of approximately 750. Transmitted-particle compositions are measured with the electrostatic-deflection method combined with a two-dimensional position-sensitive detector. In the experiments with the single microcapillary, the main transmitted component is found to be primary C$$_{60}$$ ions, which are focused in the area equal to the capillary outlet diameter. The other components are charge-exchanged C$$_{60}$$ ions and charged or neutral fragments (fullerene-like C$$_{60-2m}$$ and small C$$_{n}$$ particles), and their fractions decrease with decreasing projectile velocity. Similar results are obtained in the experiments with the multicapillary foil. It is concluded from the relative transimission fractions of more than 80% that the C$$_{60}$$ transmission fraction is considerably high for both types of the capillaries in the present velocity range.


Quantitative evaluation of charge state for internuclear distance of constituent ions dissociated from C$$_2^+$$ ion moving in a solid

千葉 敦也; 齋藤 勇一; 鳴海 一雅; 山田 圭介; 金子 敏明*

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 161, 2013/01



Reduction of charging effects on negative secondary ion TOF mass spectra of PMMA using cluster ion impacts

平田 浩一*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅; 神谷 富裕

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 165, 2013/01

Secondary ion (SI) mass spectrometry, based on the phenomenon that primary ion impacts on a target produce SIs originating from the target, is one of the most powerful tools for surface analysis. One of the difficulties in SI mass measurements of insulating targets is to stabilize the surface potential during the measurements, because ion impacts on insulating targets usually lead to an increase in the potential caused by the difference between the injected and emitted charges. We compared time-sequential variations of negative-SI TOF mass spectra of a thin PMMA film target for monoatomic (C$$_1$$$$^+$$) and cluster ions (C$$_8$$$$^+$$) impact with the same incident energy per atom (0.5 MeV/atom) to study difference in charging effects on N-SI mass spectra of insulating targets. For C$$_1$$$$^+$$ impacts, the peak shift to longer flight time and SI intensity reduction are observed. In contrast to the C$$_1$$$$^+$$ impacts, the N-SI TOF mass spectra for C$$_8$$$$^+$$ do not show the peak shift and SI intensity reduction, which shows that the surface potential is stable during the C$$_8$$$$^+$$ bombardment. The results demonstrate that N-SI TOF mass measurement of the insulating thin film target is available using cluster ions as a primary ion without charge compensation.


Ion induced luminescence from sapphire irradiated with swift cluster ion beams; Cluster ion size and energy dependences

柴田 裕実*; 齋藤 勇一; 千葉 敦也; 山田 圭介; 鳴海 一雅; 田口 光正

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 162, 2013/01

This study is to elucidate the characteristics of the interaction between energetic cluster ions and solids by means of measuring luminescence from solid surfaces irradiated with cluster ions. We report present results of luminescence measurement for the sapphire target irradiated with carbon cluster ions. Luminescent spectra from sapphire induced by 0.25-3.0 MeV/atom (21-252 keV/u) C$$_{1}$$$$^{+}$$-C$$_{8}$$$$^{+}$$ ion irradiation were measured in the wavelength range of 250-800 nm as a function of ion fluence at room temperature. The experimental results show the same tendency as a calculation of stopping power theory. This suggests that luminescence caused by irradiation defects directly relates to the stopping power of incident cluster ion.


Electronic stopping power connected with average charge reduction for swift carbon cluster ions in carbon

金子 敏明*; 井原 功介*; 河野 雅砂*; 齋藤 勇一; 千葉 敦也; 鳴海 一雅

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 164, 2013/01

The aim of this study is to present the electronic stopping power for swift carbon clusters as a basic quantity, taking account of the charge reduction effect, in order to promote attention of experimental researches and to contribute to collection of cluster-impact electronic excitation data. This theoretical research is composed of estimating the reduced average charges of constituent ions in a cluster and evaluating the electronic stopping power for a cluster, using the reduced average charges. The theoretical basis in the present study is to describe the incident cluster as an ensemble of partially stripped ions, where their charges are determined by the self-consistent cluster average-charge theory, and their spatial charge distribution is described in a statistical manner. The excitation of target electrons is treated in an electron gas model. In a case of carbon target, four electrons per atom are assumed to participate in electron gas and the rest two electrons are in the 1S state. As a result, the average charge per ion decreases with increasing the number of constituent ions in a cluster. This tendency can be understood by the theoretical model, which leads us to a conclusion that increase of the surrounding ions implies enhancement of the binding force on ionized electrons, resulting in less degree of ionization.


Visualization of a single cluster particle track in polystyrene films

麻野 敦資*; 高野 勝昌*; 千葉 敦也; 齋藤 勇一; 丸井 裕美*; 大道 正明*; 前吉 雄太*; 本庄 義人*; 佐伯 昭紀*; 山田 圭介; et al.

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 163, 2013/01

In this study, a visualization of the tracks of fragments from a dissociated cluster ion in a target was tried using polystyrene derivatives with higher sensitivity for the ion beam irradiation. The results were compared with the case of ion beam consisting of single ion, considering the feature of cluster beam irradiation. The ion species were selected to be $$^{12}$$C$$_{4}$$$$^{+}$$ and $$^{48}$$Ti$$^{+}$$. As a result, the density of the structures at the $$^{48}$$Ti$$^{+}$$ beam irradiation was almost the same to the ion fluence. However, the density at the $$^{12}$$C$$_{4}$$$$^{+}$$ irradiation was much less than the ion fluence. It is supposed that many cluster particles are fragmentized during penetration in the polymer film. The radial dose distribution inside a particle tracks is decreased, and then the cross-linking reaction is induced insufficiently. In order to visualize the tracks of the fragmentation, optimization of the development or selection of materials with higher sensitivity should be needed.


Cluster effect on damage accumulation in a Si crystal bombarded with 10-540-keV C$$_{60}$$ ions

鳴海 一雅; 楢本 洋*; 山田 圭介; 千葉 敦也; 齋藤 勇一; 前田 佳均

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 166, 2013/01

本研究では、10-100keV領域のC$$_{60}$$イオン衝撃の非線形効果を明らかにすることを目的としている。室温でSi結晶に10-540keV C$$_{60}$$イオンを照射し、1個のC$$_{60}$$イオン衝撃により格子位置から変位したSi原子数$${it N}$$$$_{D60}$$をラザフォード後方散乱/チャネリング法で評価したところ、照射損傷の照射量依存性がイオントラック的描像で説明できることがわかった。さらに、入射C原子1個あたりの変位したSi原子数の比$${it N}$$$$_{D60}$$/(60$$times$$$${it N}$$$$_{D1}$$)を使って非線形効果を評価した。ここで、$${it N}$$$$_{D1}$$は、同じ速度のCイオン衝撃により格子位置から変位したSi原子数であり、SRIM2008を使って求めた。比はC$$_{60}$$イオンのエネルギーに依存し、100keV近辺で最大になった。この比のエネルギー依存性、すなわち非線形効果のエネルギー依存性は、核的阻止能とSi中でのC原子間距離の広がりによって定性的に説明できる。


Cluster effect on projected range of 30-keV C$$_{60}$$$$^{+}$$ in silicon

森田 陽亮*; 中嶋 薫*; 鈴木 基史*; 鳴海 一雅; 齋藤 勇一; 木村 健二*

JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 167, 2013/01

本研究では、これまで飛程に対するクラスター効果がそれほど大きくないと考えられてきた$${it M}$$$$_{1}$$$$<$$$${it M}$$$$_{2}$$の場合について、それを実験的に明らかにする。ここで$${it M}$$$$_{1}$$, $${it M}$$$$_{2}$$はそれぞれ入射イオン及び標的を構成する元素の質量数である。あらかじめ表面に非晶質層を作製したSiウェファーに、30keV C$$_{60}$$$$^{+}$$と0.5keV C$$^{+}$$を室温で2$$times$$10$$^{15}$$ atoms/cm$$^{2}$$注入し、注入した炭素の深さ分布を、高分解能ラザフォード後方散乱法を用いて測定した。C$$_{60}$$注入に対するCの平均深さが6.1nmである一方、C$$^{+}$$注入の場合は4.0nmとなり、投影飛程に対する顕著なクラスター効果を観測した。

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