検索対象:     
報告書番号:
※ 半角英数字
 年 ~ 
 年

Spectroscopic tools applied to element Z = 115 decay chains

115番元素の$$alpha$$崩壊連鎖測定に適用した核分光実験ツール

Forsberg, U.*; Rudolph, D.*; Golubev, P.*; Sarmiento, L. G.*; Yakushev, A.*; Andersson, L.-L.*; Di Nitto, A.*; D$"u$llmann, Ch. E.*; Gates, J. M.*; Gregorich, K. E.*; Gross, C. J.*; He${ss}$berger, F. P.*; Herzberg, R.-D.*; Khuyagbaatar, J.*; Kratz, J. V.*; Rykaczewski, K.*; Sch$"a$del, M.; ${AA}$berg, S.*; Ackermann, D.*; Block, M.*; Brand, H.*; Carlsson, B. G.*; Cox, D.*; Derkx, X.*; Eberhardt, K.*; Even, J.*; Fahlander, C.*; Gerl, J.*; J$"a$ger, E.*; Kindler, B.*; Krier, J.*; Kojouharov, I.*; Kurz, N.*; Lommel, B.*; Mistry, A.*; Mokry, C.*; Nitsche, H.*; Omtvedt, J. P.*; Papadakis, P.*; Ragnarsson, I.*; Runke, J.*; Schaffner, H.*; Schausten, B.*; Th$"o$rle-Pospiech, P.*; Torres, T.*; Traut, T.*; Trautmann, N.*; T$"u$rler, A.*; Ward, A.*; Ward, D. E.*; Wiehl, N.*

Forsberg, U.*; Rudolph, D.*; Golubev, P.*; Sarmiento, L. G.*; Yakushev, A.*; Andersson, L.-L.*; Di Nitto, A.*; D$"u$llmann, Ch. E.*; Gates, J. M.*; Gregorich, K. E.*; Gross, C. J.*; He${ss}$berger, F. P.*; Herzberg, R.-D.*; Khuyagbaatar, J.*; Kratz, J. V.*; Rykaczewski, K.*; Sch$"a$del, M.; ${AA}$berg, S.*; Ackermann, D.*; Block, M.*; Brand, H.*; Carlsson, B. G.*; Cox, D.*; Derkx, X.*; Eberhardt, K.*; Even, J.*; Fahlander, C.*; Gerl, J.*; J$"a$ger, E.*; Kindler, B.*; Krier, J.*; Kojouharov, I.*; Kurz, N.*; Lommel, B.*; Mistry, A.*; Mokry, C.*; Nitsche, H.*; Omtvedt, J. P.*; Papadakis, P.*; Ragnarsson, I.*; Runke, J.*; Schaffner, H.*; Schausten, B.*; Th$"o$rle-Pospiech, P.*; Torres, T.*; Traut, T.*; Trautmann, N.*; T$"u$rler, A.*; Ward, A.*; Ward, D. E.*; Wiehl, N.*

115番元素の$$alpha$$崩壊連鎖測定に使用した焦点面Si検出器のセットアップと検出器プリアンプ出力のデジタル波形解析の結果及び検出器不感層による$$alpha$$線エネルギー損失の事象毎の補正解析の結果について報告する。$$alpha$$線検出器は、両面分割型Siストリップ検出器(DSSSD)5枚を箱型に配置し、115番元素を打ち込む底面検出器の片面の信号をデジタル波形解析した。底面検出器と側面検出器の2枚のSi検出器で検出された$$alpha$$線は、2枚の不感層を斜めに横切ることから$$alpha$$線エネルギー損失が事象毎に異なる。検出位置から$$alpha$$線の放射角度を求めることで事象毎にエネルギー損失を補正することで$$alpha$$線のエネルギー分解能を大幅に改善することに成功した。

A focal-plane Si detector setup applied to the spectroscopy of the element 115 $$alpha$$-decay chains was reported. Results of the digital signal analysis for preamplifier signals and of the event-by-event $$alpha$$-energy loss correction analysis were presented. The detectors consist of five double-sided Si strip detectors (DSSSD) arranged as a box, and signals from one side of the detector at the bottom of the box were digitally processed. Energy losses of $$alpha$$ particles detected by two Si detectors at the bottom and a side differs event-by-event, because each $$alpha$$ particle passed through two dead layers with a certain tilted angle. By correcting for the energy loss of each $$alpha$$ event using the angle of the $$alpha$$-particle emission extracted from the detected positions, we succeeded in improving the $$alpha$$ energy resolution significantly.

Access

:

- Accesses

InCites™

:

パーセンタイル:9.47

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.