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走査型透過X線顕微鏡による放射性元素回収用吸着材の構造解析

STXM analysis of adsorbent for effective recovery of radioactive elements

佐野 雄一   ; 渡部 創  ; 松浦 治明*; 新井 剛*

Sano, Yuichi; Watanabe, So; Matsuura, Haruaki*; Arai, Tsuyoshi*

多孔質シリカ担体上にポリマーを被覆させたマイナーアクチニド回収用吸着材について、吸着材構造にポリマー架橋度が与える影響を走査型透過X線顕微鏡(STXM)により評価した。架橋度の増加に伴いポリマーが細孔中に均一に広がるとともに、細孔が狭小化し、水分子が捕捉されやすくなることが示唆された。

For effective recovery of radioactive elements by adsorbents using polymer-immobilized silica (SiO$$_{2}$$-P) supports, the microstructure of SiO$$_{2}$$-P particles impregnated with CMPO as extractants and their change with the crosslinking degree of polymer (CDP) were investigated using STXM analysis. The results of STXM analysis suggested that the distributions of polymer are spread and impurity molecules such as H$$_{2}$$O are captured by the increase of CDP.

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