Analysis and mapping of detailed inner information of crystalline grain by wavelength-resolved neutron transmission imaging with individual Bragg-dip profile-fitting analysis

波長分解中性子透過イメージングによる単一ブラッグディッププロファイルフィッティング解析を用いた結晶粒内情報の分析とマッピング

櫻井 洋亮*; 佐藤 博隆*; 足立 望*; 諸岡 聡  ; 戸高 義一*; 加美山 隆*

Sakurai, Yosuke*; Sato, Hirotaka*; Adachi, Nozomu*; Morooka, Satoshi; Todaka, Yoshikazu*; Kamiyama, Takashi*

As a new method for evaluating single crystal and oligocrystal, pulsed neutron Bragg-dip transmission analysis/imaging method is being developed. In this study, a single Bragg-dip profile fitting analysis method was newly developed, and applied for analyzing detailed inner information in a crystalline grain position-dependently. In the method, the spectrum profile of a single Bragg-dip is analyzed at each position over a grain. As a result, it is expected that changes of crystal orientation, mosaic spread angle and thickness of a perfect crystal can be evaluated from the wavelength, the width and the integrated intensity of the Bragg-dip, respectively. For confirming this effectiveness, the method was applied to experimental data of position-dependent Bragg-dip transmission spectra of a Si-steel plate consisting of oligocrystals. As a result, inner information of multiple crystalline grains could be visualized and evaluated. The small change of crystal orientation in a grain, about 0.4, could be observed by imaging the Bragg-dip wavelengths. By imaging the Bragg-dip widths, both another grain and mosaic block in a grain were detected. Furthermore, imaging results of the integrated intensities of Bragg-dips were consistent with the results of Bragg-dip width imaging. These small crystallographic changes have not been observed and visualized by previous Bragg-dip analysis methods.