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模擬廃棄物ガラス試料のXAFS測定研究(共同研究)

XAFS measurement of simulated waste glass samples (Joint research)

永井 崇之; 捧 賢一; 岡本 芳浩; 塩飽 秀啓; 山岸 弘奈*; 太田 俊明*; 猪瀬 毅彦*; 佐藤 誠一*; 畠山 清司*; 高橋 友恵*; 柿原 敏明*

Nagai, Takayuki; Sasage, Kenichi; Okamoto, Yoshihiro; Shiwaku, Hideaki; Yamagishi, Hirona*; Ota, Toshiaki*; Inose, Takehiko*; Sato, Seiichi*; Hatakeyama, Kiyoshi*; Takahashi, Tomoe*; Kakihara, Toshiaki*

廃棄物ガラス中のガラス成分や廃棄物成分の局所構造は、固化体の化学組成によって変化する。本研究は、リン又はバナジウムを添加したホウケイ酸ガラスと模擬廃液から模擬廃棄物ガラス試料を作製し、廃棄物濃度によるガラス成分の軽元素や廃棄物成分の希土類元素等の化学状態及び局所構造をXAFS測定により評価した。

The local structures of glass-forming elements and waste elements would change by the chemical composition of waste glass including those elements. In this study, simulated waste glass samples were prepared from borosilicate glass frit including phosphorus (P) or vanadium (V), and we investigated local structures of boron, sodium, and waste elements in these P glass and V glass samples by using synchrotron XAFS measurements in soft and hard X ray region.

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