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軟X線領域のXAFS測定によるホウケイ酸ガラスの構造評価(共同研究)

Structural investigation of borosilicate glasses by using XAFS measurement in Soft X-ray region (Joint research)

永井 崇之 ; 岡本 芳浩 ; 山岸 弘奈*; 太田 俊明*; 小島 一男*; 猪瀬 毅彦*; 佐藤 誠一*; 畠山 清司*

Nagai, Takayuki; Okamoto, Yoshihiro; Yamagishi, Hirona*; Ota, Toshiaki*; Kojima, Kazuo*; Inose, Takehiko*; Sato, Seiichi*; Hatakeyama, Kiyoshi*

ホウケイ酸ガラス中のガラス成分や廃棄物成分の局所構造は、その化学組成によって変化する。本研究は、原料ガラスや模擬廃棄物ガラス試料を対象に軟X線領域のXAFS測定を実施し、ホウ素(B),酸素(O)やケイ素(Si)及び廃棄物成分の鉄(Fe)やセシウム(Cs)の化学的状態及び局所構造を評価した。化学組成や原料ガラス形態が異なるガラス試料をXAFS測定し、B及びOのK吸収端XANESスペクトルを比較すると、Na$$_{2}$$O濃度がB-Oの配位構造へ与える影響は廃棄物成分濃度による影響よりも大きく、OのK吸収端前に出現するプリエッジの高さはガラス試料に含まれるFe等の第一遷移金属元素の濃度に依存することが分かった。長期化学的耐久性を評価した浸出試験前後のガラス試料表面をXAFS測定し、OのK吸収端XANESスペクトルから、浸出試験後試料表面に新たな化合物相が形成した可能性があり、ラマン分光測定結果からも浸出試験後の試料表面状態に変化が観察された。またCsのM吸収端のXANESスペクトルから、浸出試験後試料表面のCsの消失が確認でき、Csは浸出液へ溶出し易いと考えられる。Na$$_{2}$$O濃度が異なる原料ガラスと希土類酸化物を添加したガラス試料を対象に、SiのK吸収端XANESスペクトルを測定した結果、Na$$_{2}$$O濃度が高くなるに従いSiのK吸収端ピークが低エネルギー側にシフトし、また希土類酸化物の種類によってSi周辺構造への影響が異なることを確認した。

The local structure of glass-forming elements and waste elements in borosilicate glasses varies with its chemical composition. In this study, borosilicate glass frit and simulated waste glass samples were prepared and the local structure and chemical state regarding boron(B), oxygen(O), silicon(Si) and waste elements of iron(Fe), cesium(Cs) were estimated by using XAFS measurement in soft X-ray region. Following results were obtained by XAFS measurements of prepared glass frit and simulated waste glass samples: (1) The effect of Na$$_{2}$$O concentration on B-O coordination structure is greater than that of the waste elements concentration. (2) The height of pre-edge by O K-edge spectrum depends on the concentration of first transition elements such as Fe in glass samples. Following results were obtained by XAFS measurements of simulated waste glass samples after immersion test to investigate the long chemical stability. (1) A new compound was formed on the sample surface after the immersion test, and changes in the surface state were confirmed by Raman spectroscopy. (2) Cs on the sample surface after immersion test dissolves into the leaching solution. The Si K-edge XANES spectra of borosilicate glass frits and simulated waste glass samples included lanthanides oxide were measured, and following was confirmed. (1) As the Na$$_{2}$$O concentration increases in borosilicate glass frit, the K-edge peak of Si shifts to the low energy side. (2) The peak height of the K-edge of Si differs depending on the kind of lanthanide.

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